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5.Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications
作者:Yifei Mua ; Y.Mu@student.liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author ; Ce Zhou Zhaob ; cezhou.zhao@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Yanfei Qib ; yanfei.qi01@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Sang Lamb ; s.lam@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Chun Zhaoc ; garyzhao@ust.hk" class="auth_mail" title="E-mail the corresponding author ; Qifeng Lua ; qifeng@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author ; Yutao Caib ; yutao.cai@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Ivona Z. Mitrovica ; ivona@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author ; Stephen Taylora ; s.taylor@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author ; Paul R. Chalkerd ; pchalker@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
刊名:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
出版年:2016
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