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内部出版物
在“
Elsevier电子期刊
”中,
命中:
3
条,耗时:小于0.01 秒
1.
In situ investigation of the structural defect generation and evolution during the directional solidification of 〈110〉 seeded growth Si
作者:
M.G. Tsoutsouva
a
;
T. Riberi &ndash
;
Bé
;
ridot
a
;
G. Regula
a
;
G. Reinhart
a
;
J. Baruchel
b
;
F. Guittonneau
c
;
L. Barrallier
c
;
N.
Mangelinck
-Noë
;
l
a
;
nathalie.
mangelinck
@im2np.fr"
class
="auth_mail" title="E-mail the corresponding author
关键词:
X-ray diffraction imaging
;
X-ray radiography
;
Twinning
;
Grain competition
;
Structural defects
刊名:Acta Materialia
出版年:2016
2.
Direct observation of NiSi lateral growth at the epitaxial 胃-Ni
2
Si/Si(1 0 0) interface
作者:
M. El Kousseifi
a
;
K. Hoummada
a
;
T. Epicier
b
;
D.
Mangelinck
a
;
dominique
.
mangelinck
@im2np.fr"
class
="auth_mail" title="E-mail the corresponding author
关键词:
Ni silicide
;
Lateral growth
;
Interface
;
Precipitate shape
;
Model
刊名:Acta Materialia
出版年:2015
3.
Atom probe tomography for advanced metallization
作者:
D.
Mangelinck
a
;
dominique
.
mangelinck
@im2np.fr"
class
="auth_mail
;
F. Panciera
a
;
b
;
K. Hoummada
a
;
M. El Kousseifi
a
;
C. Perrin
a
;
M. Descoins
a
;
A. Portavoce
a
关键词:
Atom probe tomography
;
Metallization
;
Ni silicide
;
High K/metal gate
;
Nanowire
;
Transistor
刊名:Microelectronic Engineering
出版年:25 May, 2014
1
按检索点细分(3)
作者(3)
按出版年细分(3)
2027年及以后(1)
2016年(1)
2015年(1)
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