设为首页
收藏本站
网站地图
|
English
|
公务邮箱
About the library
Background
History
Leadership
Organization
Readers' Guide
Opening Hours
Collections
Help Via Email
Publications
Electronic Information Resources
常用资源
电子图书
期刊论文
学位会议
外文资源
特色专题
内部出版物
在“
Elsevier电子期刊
”中,
命中:
3
条,耗时:0.1489323 秒
1.
Situational driving anger, driving performance and allocation of visual attention
作者:
Tingru Zhang
a
;
tr
zhang3
-c@my.
cityu
.edu.hk"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
;
Alan H.S. Chan
a
;
alan.chan@
cityu
.edu.hk"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
;
Yutao Ba
b
;
bb0438@163.com"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
;
Wei Zhang
b
;
zhangwei@tsinghua.edu.cn"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
关键词:
Situational anger
;
Risky driving
;
Eye movements
;
Decreased fixation dispersion
;
Simulator
刊名:Transportation Research Part F: Traffic Psychology and Behaviour
出版年:2016
2.
The association between driving anger and driving outcomes: A meta-analysis of evidence from the past twenty years
作者:
Tingru Zhang
;
tr
zhang3
-c@my.
cityu
.edu.hk"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
;
Alan H.S. Chan
alan.chan@
cityu
.edu.hk"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
关键词:
Driving anger
;
Aggressive driving
;
Risky driving
;
Driving errors
;
Accidents
;
Meta-analysis
刊名:Accident Analysis & Prevention
出版年:2016
3.
XPS study on the effects of thermal annealing on CeO
2
/La
2
O
3
stacked gate dielectrics
作者:
Jieqiong Zhang
a
;
jieq
zhang3
-c@my.
cityu
.edu.hk"
class
="auth_
mail
"
title
="E-
mail
the
corresponding
author
;
Hei Wong
a
;
Kuniyuki Kakushima
b
;
Hiroshi Iwai
b
关键词:
Thermal annealing
;
X-ray photoelectron spectroscopy (XPS)
;
Interface reaction
;
High-k dielectrics
刊名:Thin Solid Films
出版年:2016
1
按检索点细分(3)
作者(3)
按出版年细分(3)
2016年(3)
NGLC 2004-2010.National Geological Library of China All Rights Reserved.
Add:29 Xueyuan Rd,Haidian District,Beijing,PRC. Mail Add: 8324 mailbox 100083
For exchange or info please contact us via
email
.