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CNKI期刊论文0611(5)
在“
Elsevier电子期刊
”中,
命中:
569
条,耗时:0.0209895 秒
在所有数据库中总计命中:
4,755
条
1.
Influence of SAP content and curing age on air
void
distribution of high performance concrete using
3D
volume
analysis
作者:
Babatunde J. Olawuyi
a
;
babatunde@futminna.edu.ng
;
William P. Boshoff
b
;
bboshoff@sun.ac.za
关键词:
Computed tomography (CT) scanning
;
3D
-
void
analysis
;
High-performance concrete
;
Air
void
distribution
;
Superabsorbent Polymers (SAP)
;
SAP content
;
Binder type
;
Curing age
刊名:Construction and Building Materials
出版年:2017
2.
Design of electrode arrays for
3D
capacitance tomography in a planar domain
作者:
Stephen H. Taylor
a
;
b
;
Suresh V. Garimella
a
;
sureshg@purdue.edu
关键词:
Image reconstruction
;
3D
capacitance tomography
;
Optimized design
;
Electrode design
刊名:International Journal of Heat and Mass Transfer
出版年:2017
3.
Investigation into the effects of two component grout properties on surface settlements
作者:
Mohammad Sharghi
a
;
Hamid Chakeri
a
;
Yilmaz Ozcelik
b
;
yilmaz@hacettepe.edu.tr
关键词:
Shield tunneling
;
Annular gap
;
Two component grout
;
Grout properties
;
Surface settlement
;
FLAC
3D
刊名:Tunnelling and Underground Space Technology
出版年:2017
4.
Two-dimensional (2D), three-dimensional static (
3D
) and real-time (4D) contrast enhanced
void
ing urosonography (ceVUS) versus
void
ing cystourethrography (VCUG) in children with vesicoureteral reflux.
作者:
Magdalena Maria Woźniak
a
;
mwozniak@hoga.pl" class="auth_mail" title="E-mail the corresponding author
;
Andrzej Paweł Wieczorek
a
;
Agata Pawelec
a
;
Agnieszka Brodzisz
a
;
Maria Małgorzata Zajączkowska
b
;
Halina Borzęcka
b
;
Paweł Nachulewicz
c
关键词:
ceVUS
;
contrast enhanced
void
ing urosonography
;
ESPR
;
European society of paediatric radiology
;
ESUR
;
European society of urogenital radiology
;
PUU
;
pelvi-ureteral unit
;
US
;
ultrasound
;
VCUG
;
void
ing cystourethrography
;
VUR
;
vesicoureteral reflux
;
3D
;
three-dimensional
;
4D
;
four-dimensional
刊名:European Journal of Radiology
出版年:2016
5.
Effect of phase separation on mechanical strength of co-sputtering Cu(Ti) thin film in chip-level
3D
IC bonding
作者:
Po Chen Lin
;
Hao Chen
;
Hsien-Chien Hsieh
;
Albert T. Wu
;
atwu@ncu.edu.tw
关键词:
Electronic materials
;
Sputtering
;
Phase separation
;
Cu bonding
;
Co-sputtered Cu(Ti)
;
Shear test
刊名:Materials Letters
出版年:2017
6.
Discrete element simulation and experimental study of powder spreading process in additive manufacturing
作者:
S. Haeri
a
;
sina.haeri@strath.ac.uk
;
Y. Wang
b
;
Y.Wang@exeter.ac.uk
;
O. Ghita
b
;
O.Ghita@exeter.ac.uk
;
J. Sun
c
;
j.sun@ed.ac.uk
关键词:
Additive manufacturing
;
Discrete element method
;
Laser sintering
;
3D
printing
;
Powder spreading
刊名:Powder Technology
出版年:2017
7.
Volumetric parametrization from a level set boundary representation with PHT-splines
作者:
Chiu Ling Chan
c
;
Cosmin Anitescu
c
;
Timon Rabczuk
a
;
b
;
c
;
timon.rabczuk@tdt.edu.vn
关键词:
Volumetric parametrization
;
Boundary representation
;
PHT-splines
;
Level set method
刊名:Computer-Aided Design
出版年:2017
8.
Surface-etched halloysite nanotubes in mixed matrix membranes for efficient gas separation
作者:
Lei Ge
a
;
Rijia Lin
a
;
Li Wang
a
;
Thomas E. Rufford
a
;
Byron Villacorta
a
;
Shaomin Liu
b
;
Lian X. Liu
c
;
Zhonghua Zhu
a
;
z.zhu@uq.edu.au" class="auth_mail" title="E-mail the corresponding author
关键词:
Mixed matrix membranes
;
Surface modification
;
Interfacial defects
;
Halloysite nanotubes
刊名:Separation and Purification Technology
出版年:2017
9.
Effects of anisotropic
void
s on thermal properties of insulating media investigated using
3D
printed samples
作者:
Sang-Yeop Chung
a
;
sychung419@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
Dietmar Stephan
a
;
Mohamed Abd Elrahman
a
;
c
;
Tong-Seok Han
b
关键词:
Insulating media
;
Anisotropy
;
Void
distribution
;
Probabilistic characteristics
;
Thermal conductivity
;
Directional stiffness
刊名:Construction and Building Materials
出版年:2016
10.
Study of electromigration-induced formation of discrete
void
s in flip-chip solder joints by in-situ
3D
laminography observation and finite-element modeling
作者:
Yuan-Wei Chang
a
;
b
;
aone.chang@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
Yin Cheng
a
;
c
;
yin.cheng@gmx.com" class="auth_mail" title="E-mail the corresponding author
;
Feng Xu
a
;
Lukas Helfen
a
;
c
;
d
;
lukas.helfen@kit.edu" class="auth_mail" title="E-mail the corresponding author
;
Tian Tian
e
;
Marco Di Michiel
d
;
Chih Chen
b
;
King-Ning Tu
e
;
Tilo Baumbach
a
;
c
关键词:
Electromigration
;
Flip-chip
;
Laminography
;
Synchrotron radiation
;
Finite-element modeling
刊名:Acta Materialia
出版年:2016
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