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内部出版物
CNKI学位论文(1)
在“
Elsevier电子期刊
”中,
命中:
4
条,耗时:小于0.01 秒
在所有数据库中总计命中:
1
条
1.
First-principles study of oxygen and aluminum defects in 尾-Si
3
N
4
: Compensation and charge trapping
作者:
Maria Elena Grillo
;
Simon D. Elliott
;
Jes煤s Rodr铆guez
;
Rafael A帽ez
;
David Santiago Coll
;
Amit Suhane
;
Leurent Breuil
;
Antonio
Arreghini
;
Robin Degraeve
;
Ahmed Shariq
;
Volkhard Beyer
;
Malte Czernohorsky
关键词:
Silicon clusters
;
Silicon nitrides
;
Charge traps
;
Oxygen defects
;
Al defects
;
Charge transitions
刊名:Computational Materials Science
出版年:January, 2014
2.
A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
作者:
Moonju Cho
;
Robin Degraeve
;
Philippe Roussel
;
Bogdan Govoreanu
;
Ben Kaczer
;
Mohammed B. Zahid
;
Eddy Simoen
;
Antonio
Arreghini
;
Malgorzata Jurczak
;
Jan Van Houdt
;
Guido Groeseneken
关键词:
Modeling
;
Charge trapping
;
Non-volatile memory
;
Trap profile
刊名:Solid-State Electronics
出版年:2010
3.
Analysis of nitride storage non-volatile memories with HfSiO
x
作者:
Duš
;
an S. Golubović
;
Michiel J. van Duuren
;
Nader Akil
;
Antonio
Arreghini
;
Francesco Driussi
关键词:
Flash memories
;
High-K dielectrics
;
Nitride storage
;
Non-volatile memories
;
Scalability
;
SONOS
刊名:Microelectronic Engineering
出版年:2009
4.
A comparison of the performance characteristics of classification criteria for the diagnosis of psoriatic arthritis
作者:
William J. Taylor
;
Antonio
Marchesoni
;
Marco
Arreghini
;
Katharina Sokoll
;
Philip S. Helliwell
关键词:
psoriatic arthritis
;
classification criteria
刊名:Seminars in Arthritis and Rheumatism
出版年:2004
1
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