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在“Elsevier电子期刊”中，命中：11条，耗时：小于0.01 秒

在所有数据库中总计命中：158条

1.Characterization of ZnO structures by optical and X-ray methods

作者：P. Petrik ; B. Pollakowski ; S. Zakel ; T. Gumprecht ; B. Beckhoff ; M. Lemberger ; Z. Labadi ; Z. Baji ; M. Jank ; A. Nutsch

关键词：Zinc oxide ; Spectroscopic ellipsometry ; X-ray fluorescence ; Raman spectrometry ; VUV reflectometry ; Atomic layer deposition ; Sputtering

刊名：Applied Surface Science

出版年：2013

2.Silicon carbonitride nanolayers ?Synthesis and chemical characterization

作者：P.S. Hoffmann^a ; ^{dg7j@ca.tu-darmstadt.de} ; N.I. Fainer^b ; O. Baake^a ; M.L. Kosinova^b ; Y.M. Rumyantsev^b ; V.A. Trunova^b ; A. Klein^a ; B. Pollakowski^c ; B. Beckhoff^c ; W. Ensinger^a

关键词：Silicon carbonitrides ; Chemical vapor deposition ; Speciation ; Fourier transform infrared spectroscopy ; X-ray photoelectron spectroscopy ; Energy dispersive X-ray spectrometry ; Total reflection X-ray fluorescence ; Near edge X-ray absorption fine structure

刊名：Thin Solid Films

出版年：2012

3.Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens

作者：R. Unterumsberger^a ; ^{rainer.unterumsberger@ptb.de} ; M. Mü ; ller^a ; B. Beckhoff^a ; P. Hö ; nicke^a ; B. Pollakowski^a ; S. Bjeoumikhova^b

关键词：Single bounce monocapillary ; Soft X-ray radiation ; Beam profile characterization ; X-ray emission spectrometry

刊名：Spectrochimica Acta Part B: Atomic Spectroscopy

出版年：2012

4.Announcement

作者：Henry O. Pollakowski^a ; ^{hpollakowski@gsd.harvard.edu"" rel=""nofollow}

刊名：Journal of Housing Economics

出版年：2011

5.Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films

作者：Markus Krä ; mer ; Katy Roodenko ; Beatrix Pollakowski ; Karsten Hinrichs ; Jö ; rg Rappich ; Norbert Esser ; Alex von Bohlen ; Rol ; Hergenrö ; der

关键词：Optical simulations ; Infrared spectroscopic ellipsometry ; Synchrotron ; X-ray standing waves ; Surface modification

刊名：Thin Solid Films

出版年：2010

6.GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen

作者：M. Pagels ; F. Reinhardt ; B. Pollakowski ; M. Roczen ; C. Becker ; K. Lips ; B. Rech ; B. Kanngieß ; er ; B. Beckhoff

关键词：Silicon thin-film solar cell ; ZnO/Si interface ; Grazing incidence X-ray fluorescence ; Near edge X-ray absorption fine structure spectroscopy ; Depth profiles ; Reference-free

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2010

7.Chemical characterization of SiCb>xb>

作者：O. Baake ; N.I. Fainer ; P. Hoffmann ; M.L. Kosinova ; Yu.M. Rumyantsev ; V.A. Trunova ; A. Klein ; W. Ensinger ; B. Pollakowski ; B. Beckhoff ; G. Ulm

关键词：Silicon carbonitride ; Chemical bonding ; Thin film ; TXRF-NEXAFS

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2009

8.Chemical bonding in carbonitride nanolayers

作者：P. Hoffmann ; O. Baake ; B. Beckhoff ; W. Ensinger ; N. Fainer ; A. Klein ; M. Kosinova ; B. Pollakowski ; V. Trunova ; G. Ulm ; et al.

关键词：Chemical bonding ; Boron carbonitrides ; Silicon carbonitrides ; X-ray fluorescence analysis

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：2007

9.Scaling test of fermion actions in the Schwinger model

作者：N. Christian ; K. Jansen ; K. Nagai and B. Pollakowski

刊名：Nuclear Physics B

出版年：2006

10.Special issue on housing policy

作者：Gabriel ; Stuart ; Pollakowski ; Henry O. ; Wachter ; Susan

刊名：Journal of Housing Economics

出版年：2002

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2002年(2)