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在“
Elsevier电子期刊
”中,
命中:
2,003
条,耗时:0.0229882 秒
在所有数据库中总计命中:
31,676
条
1.
Substations SF6
circuit
breakers:
Reliability
evaluation based on equipment condition
作者:
Elaine A.L. Vianna
a
;
elainelimavianna@yahoo.com.br" class="auth_mail" title="E-mail the corresponding author
;
elaine.vianna@eletronorte.gov.br" class="auth_mail" title="E-mail the corresponding author
;
Alzenira R. Abaide
a
;
Luciane N. Canha
a
;
Vladimiro Miranda
b
关键词:
Substation
;
Circuit
breaker
;
Maintenance
;
Fuzzy Logic
;
Reliability
刊名:Electric Power Systems Research
出版年:2017
2.
Single event double node upset tolerance in MOS/spintronic sequential and combinational logic
circuit
s
作者:
Ramin Rajaei
r_rajaei@sbu.ac.ir
关键词:
STT-MRAM
;
Magnetic tunnel junction (MTJ)
;
Nonvolatility
;
Radiation immunity
;
Soft error
;
Single event upset (SEU)
;
Single event double node upset (SEDU)
刊名:Microelectronics
Reliability
出版年:2017
3.
Multi objective optimal allocation of fault current limiters in power system
作者:
Ali Mahmoudian
;
ali.mahmoudian@semnan.ac.ir" class="auth_mail" title="E-mail the corresponding author
;
Mohsen Niasati
mniasati@semnan.ac.ir" class="auth_mail" title="E-mail the corresponding author
;
Mojtaba Ahmadieh Khanesar
ahmadieh@semnan.ac.ir" class="auth_mail" title="E-mail the corresponding author
关键词:
Fault
;
Fault current limiter
;
Multiobjective optimization
;
Reliability
;
Short
circuit
current
刊名:International Journal of Electrical Power & Energy Systems
出版年:2017
4.
An ultra-wideband CMOS PA with dummy filling for
reliability
作者:
Yu-Ting Chang
a
;
Yu Ye
a
;
Hongtao Xu
b
;
Calvin Domier
a
;
N.C. Luhmann Jr
a
;
Q. Jane Gu
a
;
jgu@ucdavis.edu
关键词:
CMOS
;
Power amplifier
;
Transformer
;
V-band
刊名:Solid-State Electronics
出版年:2017
5.
Reduction in the short-
circuit
current density of silicon heterojunction photovoltaic modules subjected to potential-induced degradation tests
作者:
Seira Yamaguchi
a
;
s-yamaguchi@jaist.ac.jp
;
Chizuko Yamamoto
b
;
Keisuke Ohdaira
a
;
ohdaira@jaist.ac.jp
;
Atsushi Masuda
b
;
atsushi-masuda@aist.go.jp
关键词:
Potential-induced degradation
;
Silicon heterojunction solar cell
;
Photovoltaic module
;
Optical loss
;
Ionomer encapsulant
刊名:Solar Energy Materials and Solar Cells
出版年:2017
6.
Performance evaluation of a point of load for the upgrade of the ATLAS - LAr calorimeter
作者:
M. Lazzaroni
a
;
b
;
massimo.lazzaroni@unimi.it
;
massimo.lazzaroni@cern.ch
;
M. Citterio
b
;
S. Latorre
b
关键词:
Points of load
;
Measurement
;
LHC
;
High-B tolerance
;
Reliability
;
Dependability
;
Hostile environment
刊名:Measurement
出版年:2017
7.
Laminar Organization of Attentional Modulation in Macaque Visual Area V4
作者:
Anirvan S. Nandy
1
;
3
;
nandy@snl.salk.edu
;
Jonathan J. Nassi
1
;
2
;
John H. Reynolds
1
关键词:
attention
;
laminar
circuit
;
area V4
刊名:Neuron
出版年:2017
8.
A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs
作者:
Xiuqin Xu
;
Jiongjiong Mo
;
Wei Chen
;
Zhiyu Wang
;
zywang@zju.edu.cn
;
Yongheng Shang
;
Yang Wang
;
Qin Zheng
;
Liping Wang
;
Zhengliang Huang
;
Faxin Yu
关键词:
Equivalent thermal analysis
;
GaAs PHEMT MMIC
;
ANSYS ICEPAK
;
Infrared thermography
刊名:Microelectronics
Reliability
出版年:2017
9.
Efficient
reliability
evaluation methodologies for combinational
circuit
s
作者:
Hao Cai
;
hao.cai@telecom-paristech.fr" class="auth_mail" title="E-mail the corresponding author
;
Kaikai Liu
;
Lirida Alves de Barros Naviner
;
You Wang
;
Mariem Slimani
;
Jean-Franç
;
ois Naviner
关键词:
Reliability
evaluation
;
Probabilistic transfer matrix
;
Digital
circuit
s
刊名:Microelectronics
Reliability
出版年:2016
10.
The defect-centric perspective of device and
circuit
reliability
—From gate oxide defects to
circuit
s
作者:
B. Kaczer
a
;
ben.kaczer@imec.be" class="auth_mail" title="E-mail the corresponding author
;
J. Franco
a
;
P. Weckx
a
;
1
;
Ph.J. Roussel
a
;
M. Simicic
a
;
1
;
V. Putcha
a
;
1
;
E. Bury
a
;
1
;
M. Cho
a
;
R. Degraeve
a
;
D. Linten
a
;
G. Groeseneken
a
;
1
;
P. Debacker
a
;
B. Parvais
a
;
P. Raghavan
a
;
F. Catthoor
a
;
1
;
G. Rzepa
b
;
M. Waltl
b
;
W. Goes
b
;
T. Grasser
b
关键词:
Variability
;
Reliability
;
Defects
;
RTN
;
BTI
;
HCI
;
Circuit
simulations
刊名:Solid State Electronics
出版年:2016
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