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知网期刊论文(1989)
在“
Elsevier电子期刊
”中,
命中:
2,596
条,耗时:0.0219979 秒
在所有数据库中总计命中:
4,782
条
1.
Depth
profiling
investigation by pARXPS and MEIS of advanced transistor technology gate stack
作者:
L. Fauquier
a
;
b
;
c
;
laurent.fauquier@st.com
;
B. Pelissier
b
;
c
;
D. Jalabert
b
;
d
;
F. Pierre
b
;
e
;
R. Gassilloud
b
;
e
;
D. Doloy
a
;
C. Beitia
b
;
e
;
T. Baron
b
;
c
关键词:
Depth
profiling
;
pARXPS
;
MEIS
;
HfON
;
SiON
;
HKMG
刊名:Microelectronic Engineering
出版年:2017
2.
Identification of Chinese medicinal fungus Cordyceps sinensis by
depth
-
profiling
mid-infrared photoacoustic spectroscopy
作者:
Changwen Du
a
;
chwdu@issas.ac.cn
;
Jianmin Zhou
a
;
Jianfeng Liu
b
关键词:
Cordyceps sinensis
;
Photoacoutic spectroscopy
;
Depth
-
profiling
;
Principal component analysis
;
Probabilistic neural network
;
Identification
刊名:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
出版年:2017
3.
XPS
depth
profiling
of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach
关键词:
XPS
depth
profiling
;
Surface reactions
;
Amine derivatization
;
TFBA
;
Plasma polymers
刊名:Applied Surface Science
出版年:2017
4.
Peak position differences observed during XPS sputter
depth
profiling
of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries
作者:
S. Oswald
;
s.oswald@ifw-dresden.de
;
M. Hoffmann
;
M. Zier
关键词:
XPS
;
Li-ion battery
;
Energy reference
;
Carbon anode material
;
SEI
刊名:Applied Surface Science
出版年:2017
5.
Optimization of the
depth
resolution for deuterium
depth
profiling
up to large
depth
s
作者:
B. Wielunska
;
Barbara.Wielunska@ipp.mpg.de" class="auth_mail" title="E-mail the corresponding author
;
M. Mayer
;
T. Schwarz-Selinger
关键词:
Deuterium
depth
profiling
;
Depth
profiling
;
Ion beam analysis
;
D(3He
;
p)4He
;
Depth
resolution
;
Optimization of the
depth
resolution
刊名:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
出版年:2016
6.
Characterization of thin film tandem solar cells by radiofrequency pulsed glow discharge - Time of flight mass spectrometry
作者:
Beatriz Fernandez
a
;
fernandezbeatriz@uniovi.es
;
Lara Lobo
a
;
Nies Reininghaus
b
;
Rosario Pereiro
a
;
mrpereiro@uniovi.es
;
Alfredo Sanz-Medel
a
关键词:
Thin film solar cells
;
Tandem-junctions solar cells
;
Depth
profiling
analysis
;
Glow discharge
;
Time of flight mass spectrometry
刊名:Talanta
出版年:2017
7.
Insights into low- to moderate-temperature recrystallization of zircon: Unpolished crystal
depth
profile techniques and geochemical mapping
作者:
C.J. Kelly
a
;
ckell085@uottawa.ca
;
D.A. Schneider
a
;
S.E. Jackson
b
;
T. Kalbfleisch
a
;
C.R. McFarlane
c
关键词:
Zircon
;
U-Pb geochronology
;
Trace element geochemistry
;
SIMS
;
LA-ICP-MS
;
Recrystallization
刊名:Chemical Geology
出版年:2017
8.
Deep Diffusion of Phosphorus in Silicon using Microsecond-pulsed Laser Doping
作者:
Som Mondal
;
s_mondal@iitb.ac.in
;
Chetan Singh Solanki
chetanss@iitb.ac.in
关键词:
Deep diffusion
;
EBIC
;
Junction
depth
;
Laser doping
刊名:Materials Science in Semiconductor Processing
出版年:2017
9.
Spatial variability of E. coli in an urban salt-wedge estuary
作者:
Dusan Jovanovic
a
;
dusan.jovanovic@monash.edu
;
Rhys Coleman
b
;
rhys.coleman@melbournewater.com.au
;
Ana Deletic
a
;
ana.deletic@monash.edu
;
David McCarthy
a
;
david.mccarthy@monash.edu
关键词:
Depth
profiling
;
Spatial distribution
;
Faecal contamination
;
Pathogens
;
Stratified estuary
刊名:Marine Pollution Bulletin
出版年:2017
10.
Quantitative
depth
profiling
of Si
1-x
Ge
x
structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry
作者:
M.N. Drozdov
a
;
b
;
Y.N. Drozdov
a
;
b
;
A. Csik
c
;
A.V. Novikov
a
;
b
;
K. Vad
c
;
P.A. Yunin
a
;
b
;
D.V. Yurasov
a
;
b
;
S.F. Belykh
d
;
G.P. Gololobov
e
;
D.V. Suvorov
e
;
A. Tolstogouzov
e
;
f
;
a.tolstoguzov@fct.unl.pt" class="auth_mail" title="E-mail the corresponding author
关键词:
Electron-gas secondary neutral mass spectrometry (SNMS)
;
Mixing-roughness-information
depth
model (MRI)
;
Reference samples
;
Si1&ndash
;
xGex structures
;
Sputter
depth
profiling
;
Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
刊名:Thin Solid Films
出版年:2016
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