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在“Elsevier电子期刊”中，命中：68条，耗时：0.0789617 秒

在所有数据库中总计命中：313条

1.Characterization of high energy Xe ion irradiation effects in single crystal molybdenum with depth-resolved synchrotron microbeam diffraction

作者：Di Yun^a ; ^b ; ^{diyun1979@xjtu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Yinbin Miao^c ; Ruqing Xu^a ; Zhigang Mei^a ; Kun Mo^a ; Walid Mohamed^a ; Bei Ye^a ; Michael J. Pellin^a ; Abdellatif M. Yacout^a

关键词：Microbeam X-ray diffraction ; Heavy ion irradiation ; Molecular dynamics ; Depth-resolved X-ray diffraction

刊名：Journal of Nuclear Materials

出版年：2016

2.Synthesis, structural characterization and thermoluminescence glow curve study of gadolinium-doped Y₂O₃ nanophosphor

作者：Raunak Kumar Tamrakar^a ; ^{raunak.ruby@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; ^{raunak.physics@gmail.com" class="auth_mail" title="E-mail the corresponding author} ; Vikas Dubey^b

关键词：Y2O3 ; Gd3+ ; X-ray diffraction ; Scanning electron microscopy ; Transmission electron microscopy ; Thermoluminescence

刊名：Journal of Taibah University for Science

出版年：2016

3.Spatial and depth-resolved studies of air plasma-sprayed hydroxyapatite coatings by means of diffraction techniques: Part I

作者：Tshepo P. Ntsoane^a ; ^e ; ^{tshepo.ntsoane@necsa.co.za" class="auth_mail" title="E-mail the corresponding author} ; Mira Topic^b ; ^{mtopic@tlabs.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Margit Hä ; rting^c ; ^{margit.harting@uct.ac.za" class="auth_mail" title="E-mail the corresponding author} ; Robert B. Heimann^d ; ^{robert.heimann@ocean-gate.de" class="auth_mail" title="E-mail the corresponding author} ; Chris Theron^e ; ^{Chris.Theron@up.ac.za" class="auth_mail" title="E-mail the corresponding author}

关键词：Plasma-sprayed hydroxyapatite coatings ; X-ray diffraction ; Quantitative phase analysis ; Degree of crystallinity ; Residual stress

刊名：Surface and Coatings Technology

出版年：2016

4.Time-resolved X-ray diffraction studies of solidification microstructure evolution in welding

作者：W.U. Mirihanage^a ; ^{wajira.mirihanage@ntnu.no" class="auth_mail} ; M. Di Michiel^b ; A. Reiten^a ; L. Arnberg^c ; H.B. Dong^d ; R.H. Mathiesen^a

关键词：Solidification ; Welding ; Dendrite re-orientation ; In situ X-ray diffraction

刊名：Acta Materialia

出版年：15 April, 2014

5.Low Growth Temperature MOCVD InGaP for Multi-junction Solar Cells

作者：N. Armani^a ; ; G. Abagnale^a ; F.Trespidi^a ; M. Cornelli^a ; G. Timò ; ^a ; E. Malvisi^a ; F. Farina^a ; G. Carbi^a ; F. Rossi^b ; F. Fabbri^b ; L. Nasi^b

关键词：Compound Semiconductors ; Materials Characterization ; Concentrator Photovoltaics

刊名：Energy Procedia

出版年：2015

6.64-Pixel linear-array Si-APD detector for X-ray time-resolved experiments

作者：S. Kishimoto ; H. Yonemura ; S. Adachi ; S. Shimazaki ; M. Ikeno ; M. Saito ; T. Taniguchi ; M. Tanaka

关键词：Silicon avalanche photodiodes ; Pixel detectors ; Fast-pulse processing ; Synchrotron X-rays

刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

出版年：11 December, 2013

7.Diffraction residual stress analysis in technical components ¡ª Status and prospects

作者：T. Manns ; B. Scholtes ^{scholtes@uni-kassel.de}

关键词：X-ray diffraction ; Residual stress ; Penetration depth ; Laplace space ; Real space

刊名：Thin Solid Films

出版年：2013

8.Application of data fusion techniques to direct geographical traceability indicators

作者：Michele Silvestri ; Lucia Bertacchini ; Caterina Durante ; Andrea Marchetti ; Elisa Salvatore ; Marina Cocchi ; ^{marina.cocchi@unimore.it}

关键词：Multivariate curve resolution ; Hierarchical data fusion ; X-ray powder diffraction ; Soils characterization ; Geographical traceability markers

刊名：Analytica Chimica Acta

出版年：2013

9.The influence of different locations of sputter guns on the morphological and structural properties of Cu-In-Ga precursors and Cu(In,Ga)Se₂ thin films

作者：J. Wang ; J. Zhu ; Y.X. He

关键词：Tilted-location ; Upright-location ; Cu(In ; Ga)Se2 (CIGS) ; Raman spectra ; Ordered vacancy compounds (OVC)

刊名：Applied Surface Science

出版年：1 January, 2014

10.Kapitza conductance of Bi/sapphire interface studied by depth- and time-resolved X-ray diffraction

作者：Y.M. Sheu^a ; ^{ymsheu@lanl.gov"" rel=""nofollow} ; M. Trigo^b ; ^c ; Y.J. Chien^d ; C. Uher^d ; D.A. Arms^e ; E.R. Peterson^e ; D.A. Walko^e ; E.C. Landahl^f ; J. Chen^b ; ^c ; S. Ghimire^b ; ^c ; D.A. Reis^b ; ^c

关键词：A. Bismuth ; D. Kapitza conductance ; E. Ultrafast ; E. X-rays

刊名：Solid State Communications

出版年：2011

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