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内部出版物
CNKI学位论文(13)
知网期刊论文(4)
在“
Elsevier电子期刊
”中,
命中:
13
条,耗时:小于0.01 秒
在所有数据库中总计命中:
17
条
1.
First total synthesis of labeled EPA and DHA-derived A-type cyclopentenone isoprostanoids: [D
2
]-15-A
3t
-IsoP and [D
2
]-17-A
4t
-NeuroP
作者:
Alessio Porta
;
Enrico
Brunoldi
;
Giuseppe
Zanoni
;
Giovanni Vidari
关键词:
Labeled A4-neuroprostane
;
Labeled A3-isoprostane
;
Oxidative stress
;
Total synthesis
;
EPA and DHA peroxidation
刊名:Tetrahedron
出版年:18 February, 2014
2.
Biology and chemistry of neuroprostanes. First total synthesis of 17-A
4
-NeuroP: Validation of a convergent strategy to a number of cyclopentenone neuroprostanes
作者:
Alessio Porta
;
Maurizio Pasi
;
Enrico
Brunoldi
;
Giuseppe
Zanoni
;
Giovanni Vidari
关键词:
A4-Neuroprostanes
;
Docosahexaenoic acid (DHA)
;
Oxidative stress
;
Total synthesis
;
17-A4-NeuroP
刊名:Chemistry and Physics of Lipids
出版年:2013
3.
Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications
作者:
Cl¨¦ment Fleury
;
Rimma Zhytnytska
;
Sergey Bychikhin
;
Mattia Cappriotti
;
Oliver Hilt
;
Domenica Visalli
;
Gaudenzio Meneghesso
;
Enrico
Zanoni
;
Joachim W¨¹rfl
;
Joff Derluyn
;
Gottfried Strasser
;
Dionyz Pogany
刊名:Microelectronics Reliability
出版年:2013
4.
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
作者:
Aless
;
ro Compagnin
;
Matteo Meneghini
;
Marco Barbato
;
Valentina Giliberto
;
Andrea Cester
;
Massimo Vanzi
;
Giovanna Mura
;
Enrico
Zanoni
;
Gaudenzio Meneghesso
刊名:Microelectronics Reliability
出版年:2013
5.
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress
作者:
Valerio Di Lecce
;
Michele Esposto
;
Matteo Bonaiuti
;
Gaudenzio Meneghesso
;
Enrico
Zanoni
;
Fausto Fantini
;
Aless
;
ro Chini
刊名:Microelectronics Reliability
出版年:2010
6.
Reliability evaluation for Blu-Ray laser diodes
作者:
Matteo Meneghini
;
Nicola Trivellin
;
Kenji Orita
;
Masaaki Yuri
;
Tsuyoshi Tanaka
;
Daisuke Ueda
;
Enrico
Zanoni
;
Gaudenzio Meneghesso
刊名:Microelectronics Reliability
出版年:2010
7.
Reliability analysis of InGaN Blu-Ray laser diode
作者:
Nicola Trivellin
;
Matteo Meneghini
;
Gaudenzio Meneghesso
;
Enrico
Zanoni
;
Kenji Orita
;
Masaaki Yuri
;
Tsuyoshi Tanaka
;
Daisuke Ueda
刊名:Microelectronics Reliability
出版年:2009
8.
Thermal storage effects on AlGaN/GaN HEMT
作者:
Francesca Danesin
;
Augusto Tazzoli
;
Franco Zanon
;
Gaudenzio Meneghesso
;
Enrico
Zanoni
;
Antonio Cetronio
;
Claudio Lanzieri
;
Simone Lavanga
;
Marco Peroni
;
Paolo Romanini
刊名:Microelectronics Reliability
出版年:2008
9.
High-temperature failure of GaN LEDs related with passivation
作者:
Matteo Meneghini
;
Lorenzo Trevisanello
;
Gaudenzio Meneghesso
;
Enrico
Zanoni
;
Francesca Rossi
;
Maura Pavesi
;
Ulrich Zehnder
;
Uwe Strauss
关键词:
Gallium nitride
;
Degradation
;
Hydrogen
;
Passivation
刊名:Superlattices and Microstructures
出版年:2006
10.
Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors
作者:
Meneghesso
;
Gaudenzio
;
Zanoni
;
Enrico
刊名:Microelectronics Reliability
出版年:2002
1
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