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在“Elsevier电子期刊”中，命中：107条，耗时：0.0499499 秒

在所有数据库中总计命中：701条

1.Fabrication of Micro/Nanoelectrode Using Focused-ion-Beam Chemical Vapor Deposition, and its Application to Micro-ECDM

作者：Dengji Guo^a ; Xiaoyu Wu^a ; ^{wuxy@szu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Jianguo Lei^a ; Bin Xu^a ; Reo Kometani^b ; Feng Luo^a

关键词：Micro electro-chemical discharge machining ; Micro/nanoelectrode ; Micro-hole ; Focused-ion-beam chemical vapor deposition ; Three-dimensional

刊名：Procedia CIRP

出版年：2016

2.Cost effective MEMS fabrication of a nanowire characterization platform with solder coated electrodes

作者：S.Hoda Moosavi ; ^{hoda.moosavi@imtek.uni-freiburg.de" class="auth_mail" title="E-mail the corresponding author}Author Vitae ; Michael Kroener ^{kroener@imtek.de" class="auth_mail" title="E-mail the corresponding author}Author Vitae ; Peter Woias ^{woias@imtek.de" class="auth_mail" title="E-mail the corresponding author}Author Vitae

关键词：PVD ; physical vapor deposition ; TMAH ; tetramethylammonium hydroxide ; KOH ; potassium hydroxide ; HCL ; hydrogen chloride ; TNCP ; thermoelectric nanowire characterization platform ; TEM ; transmission electron microscopy ; FIB ; Focused ion beam ; SEM ; scanning electron microscope ; LPCVD ; low-pressure chemical vapor deposition ; Ti ; Titanium ; Pt ; Platinum ; FEM ; finite element method ; IBE ; ion beam etching ; RIE ; reactive ion etching ; ICP ; inductively coupled plasma ; In ; Indium ; Bi ; Bismuth ; Sn ; Tin

刊名：Sensors and Actuators A: Physical

出版年：2016

3.A comparison of three different notching ions for small-scale fracture toughness measurement

作者：James P. Best^a ; ^{james.best@empa.ch" class="auth_mail" title="E-mail the corresponding author} ; Johannes Zechner^a ; ¹ ; Ivan Shorubalko^b ; Jozef Vincenc Oboňa^c ; Juri Wehrs^a ; Marcus Morstein^d ; Johann Michler^a

关键词：Physical vapor deposition (PVD) ; Ion-beam processing ; Micromechanics ; Toughness ; Ceramic thin films

刊名：Scripta Materialia

出版年：2016

4.Nanorough titanium surfaces reduce adhesion of Escherichia coli and Staphylococcus aureus via nano adhesion points

作者：Claudia Lü ; decke^a ; ^b ; ^d ; Martin Roth^b ; ^d ; Wenqi Yu^c ; Uwe Horn^b ; ^d ; Jö ; rg Bossert^a ; ^d ; Klaus D. Jandt^a ; ^d ; ^{k.jandt@uni-jena.de" class="auth_mail" title="E-mail the corresponding author}

关键词：Nanoroughness ; Microbial adhesion ; Titanium ; SEM ; Focused ion beam

刊名：Colloids and Surfaces B: Biointerfaces

出版年：2016

5.Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy

作者：W. Kada^a ; ^{kada.wataru@gunma-u.ac.jp" class="auth_mail" title="E-mail the corresponding author} ; Y. Kambayashi^a ; ^b ; Y. Ando^a ; ^b ; S. Onoda^b ; H. Umezawa^c ; Y. Mokuno^c ; S. Shikata^d ; T. Makino^b ; M. Koka^b ; O. Hanaizumi^a ; T. Kamiya^b ; T. Ohshima^b

关键词：CVD diamond ; Deep-levels ; Alpha particle induced charge transient spectroscopy (APQTS) ; Heavy ion induced charge transient spectroscopy (HIQTS)

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

6.Mechanical properties of aluminum, zirconium, hafnium and tantalum oxides and their nanolaminates grown by atomic layer deposition

作者：Taivo Jõ ; giaas^a ; ^{taivo.jogiaas@ut.ee" class="auth_mail" title="E-mail the corresponding author} ; Roberts Zabels^b ; Aile Tamm^a ; Maido Merisalu^a ; Irina Hussainova^c ; Mikko Heikkilä ; ^d ; Hugo Mä ; ndar^a ; Kaupo Kukli^a ; ^d ; Mikko Ritala^d ; Markku Leskelä ; ^d

关键词：CVD ; chemical vapor deposition ; ALD ; atomic layer deposition ; XRR ; X-ray reflection ; SEM ; scanning electron microscopy ; FIB ; focused ion beam ; XRD ; X-ray diffraction

刊名：Surface and Coatings Technology

出版年：2015

7.Effect of sputtered Mo interlayers on Si (100) substrates for the deposition of diamond film by hot filament chemical vapor deposition

作者：Qiuping Wei ; Taimin Yang ; K.C. Zhou ; Li Ma ; P. Zheng ; Jie Li ; D. Zhang ; Zhou Li ; Z.M. Yu

关键词：Diamond films ; Hot filament chemical vapor deposition (HFCVD) ; Filament&ndash ; substrate distance ; Mo interlayer ; Si (100) ; Ultra-smooth nano-crystalline diamond

刊名：Surface and Coatings Technology

出版年：2013

8.Electroless deposition of a Ag matrix on semiconducting one-dimensional nanostructures

作者：F.L. Miguel^a ; ^{f.miguel@mx.uni-saarland.de} ; H. Shen^b ; F. Soldera^a ; T. Fischer^b ; R. Mü ; ller^b ; S. Mathur^b ; F. Mü ; cklich^a

关键词：Nanocomposites ; Electroless deposition ; Electrical contacts ; Focused ion beam tomography ; Thin films ; Porosity

刊名：Thin Solid Films

出版年：2013

9.Studies of dodecaphenyl polyhedral oligomeric silsesquioxane thin films on Si(1 0 0) wafers

作者：Bartosz Handke^a ; ^{bhandke@agh.edu.pl" class="auth_mail} ; 艁ukasz Klita^a ; Jacek Nizio艂^b ; Witold Jastrz臋bski^a ; Anna Adamczyk^a

关键词：Thin film ; Physical vapor deposition ; Grazing-incidence X-ray Diffraction ; Fourier Transform Infrared Spectroscopy ; Ellipsometry ; Atomic Force Microscopy

刊名：Journal of Molecular Structure

出版年：22 May, 2014

10.Humidity sensing characteristics of focused ion beam-induced suspended single tungsten nanowire

作者：Jaesam Sim ; Jungwook Choi ; Jongbaeg Kim

关键词：Humidity sensing characteristics ; Suspended single nanowire ; FIB ; CVD ; Electrothermal sensing ; Chemical sensing

刊名：Sensors and Actuators B: Chemical

出版年：April, 2014

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