设为首页
收藏本站
网站地图
|
English
|
公务邮箱
About the library
Background
History
Leadership
Organization
Readers' Guide
Opening Hours
Collections
Help Via Email
Publications
Electronic Information Resources
常用资源
电子图书
期刊论文
学位会议
外文资源
特色专题
内部出版物
CNKI学位论文(22)
在“
Elsevier电子期刊
”中,
命中:
19
条,耗时:小于0.01 秒
在所有数据库中总计命中:
22
条
1.
Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes
作者:
Halil Kü
;
kner
a
;
b
;
halil.kukner@imec.be" class="auth_mail" title="E-mail the corresponding author
Author Vitae
;
Pieter Weckx
a
;
b
Author Vitae
;
Sé
;
bastien Morrison
a
;
b
Author Vitae
;
Jacopo Franco
a
Author Vitae
;
Maria Toledano-Luque
a
Author Vitae
;
Moonju Cho
a
Author Vitae
;
Praveen Raghavan
a
Author Vitae
;
Ben Kaczer
a
Author Vitae
;
Doyoung Jang
a
Author Vitae
;
Kenichi Miyaguchi
a
Author Vitae
;
Marie Garcia Bardon
a
Author Vitae
;
Francky Catthoor
a
;
b
Author Vitae
;
Liesbet Van der Perre
a
;
b
Author Vitae
;
Rudy Lauwereins
a
;
b
Author Vitae
;
Guido
Groeseneken
a
;
b
Author Vitae
关键词:
Bias temperature instability
;
Integrated circuit reliability
;
Aging
;
Planar FET
;
FinFET
;
Library characterization
刊名:Microprocessors and Microsystems
出版年:2015
2.
Determination of energy and spatial distribution of oxide border traps in In
0.53
Ga
0.47
As MOS capacitors from capacitance-voltage characteristics measured at various temperatures
作者:
Chunmeng Dou
a
;
c
;
e
;
dou.c.aa@m.titech.ac.jp" class="auth_mail
;
Dennis Lin
a
;
Abhitosh Vais
a
;
b
;
Tsvetan Ivanov
a
;
b
;
Han-Ping Chen
f
;
Koen Martens
a
;
Kuniyuki Kakushima
d
;
Hiroshi Iwai
c
;
Yuan Taur
f
;
Aaron Thean
a
;
Guido
Groeseneken
a
;
b
刊名:Microelectronics Reliability
出版年:April, 2014
3.
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
作者:
Halil K眉kner
;
Pieter Weckx
;
Praveen Raghavan
;
Ben Kaczer
;
Francky Catthoor
;
Liesbet Van der Perre
;
Rudy Lauwereins
;
Guido
Groeseneken
关键词:
Reliability
;
Bias temperature instability
;
Atomistic trap-based model
;
Periodic vs. non-periodic stimuli
;
Gate degradation
;
Drive strength
刊名:Microprocessors and Microsystems
出版年:November, 2013
4.
Modeling the impact of junction angles in tunnel field-effect transistors
作者:
Kuo-Hsing Kao
a
;
b
;
kaofrank@imec.be
;
Anne S. Verhulst
a
;
William G. Vandenberghe
a
;
b
;
Bart Soré
;
e
a
;
c
;
Guido
Groeseneken
a
;
b
;
Kristin De Meyer
a
;
b
关键词:
Band-to-band tunneling
;
Tunnel field-effect transistor
;
Modeling
;
Junction angle
;
Tunnel path
刊名:Solid-State Electronics
出版年:2012
5.
Correlation between number of walls and diameter in multiwall carbon nanotubes grown by chemical vapor deposition
作者:
Nicolò
;
Chiodarelli
a
;
b
;
nicolo.chiodarelli@cea.fr
;
Olivier Richard
a
;
Hugo Bender
a
;
Marc Heyns
a
;
c
;
Stefan De Gendt
a
;
d
;
Guido
Groeseneken
a
;
b
;
Philippe M. Vereecken
a
;
e
刊名:Carbon
出版年:2012
6.
Study of nitrogen impact on V
FB
–EOT roll-off by varying interfacial SiO
2
thickness
作者:
Moonju Cho
;
a
;
Moon.Ju.Cho@imec.be"" rel=""nofollow
;
Amal Akheyar
a
;
Marc Aoulaiche
a
;
Robin Degraeve
a
;
Lars-Å
;
ke Ragnarsson
a
;
Joshua Tseng
a
;
Thomas Y. Hoffmann
a
;
Guido
Groeseneken
a
关键词:
V
FB
roll-off
;
Nitrogen
;
Charge pumping
;
NBTI
;
Dielectric reliability
刊名:Solid-State Electronics
出版年:2011
7.
Advanced PBTI reliability with 0.69 nm EOT GdHfO gate dielectric
作者:
Moonju Cho
a
;
Moon.Ju.Cho@imec.be"" rel=""nofollow
;
Marc Aoulaiche
a
;
Robin Degraeve
a
;
Ben Kaczer
a
;
Thomas Kauerauf
a
;
Lars-Å
;
ke Ragnarsson
a
;
Christoph Adelmann
a
;
Sven Van Elshocht
a
;
Thomas Y. Hoffmann
a
;
Guido
Groeseneken
a
;
b
关键词:
PBTI
;
Thin EOT
;
Dielectric reliability
;
SILC
刊名:Solid-State Electronics
出版年:2011
8.
Integration and electrical characterization of carbon nanotube via interconnects
作者:
Nicolo’
;
Chiodarelli
a
;
b
;
chiodarn@imec.be
;
Yunlong Li
a
;
Daire J. Cott
a
;
Sofie Mertens
a
;
Nick Peys
a
;
Marc Heyns
a
;
c
;
Stefan De Gendt
a
;
d
;
Guido
Groeseneken
a
;
b
;
Philippe M. Vereecken
a
;
e
;
vereeck@imec.be
关键词:
Carbon nanotubes
;
CNT
;
Interconnect
;
Electrical characterization
;
Contact
;
Integration
刊名:Microelectronic Engineering
出版年:2011
9.
Carbon nanotube–carbon nanotube contacts as an alternative towards low resistance horizontal interconnects
作者:
Claudia A. Santini
a
;
b
;
claudia.a.santini@gmail.com"" rel=""nofollow
;
Alexander Volodin
a
;
Chris Van Haesendonck
a
;
Stefan De Gendt
b
;
c
;
Guido
Groeseneken
b
;
d
;
Philippe M. Vereecken
b
;
e
刊名:Carbon
出版年:2011
10.
A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
作者:
Moonju Cho
;
Robin Degraeve
;
Philippe Roussel
;
Bogdan Govoreanu
;
Ben Kaczer
;
Mohammed B. Zahid
;
Eddy Simoen
;
Antonio Arreghini
;
Malgorzata Jurczak
;
Jan Van Houdt
;
Guido
Groeseneken
关键词:
Modeling
;
Charge trapping
;
Non-volatile memory
;
Trap profile
刊名:Solid-State Electronics
出版年:2010
1
2
按检索点细分(19)
作者(19)
按出版年细分(19)
2027年及以后(2)
2015年(1)
2012年(2)
2011年(4)
2010年(2)
2008年(1)
2005年(2)
2004年(1)
2000年及以前(4)
NGLC 2004-2010.National Geological Library of China All Rights Reserved.
Add:29 Xueyuan Rd,Haidian District,Beijing,PRC. Mail Add: 8324 mailbox 100083
For exchange or info please contact us via
email
.