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CNKI学位论文(36)
知网期刊论文(3)
在“
Elsevier电子期刊
”中,
命中:
16
条,耗时:小于0.01 秒
在所有数据库中总计命中:
39
条
1.
Processor-level reliability simulator for time-dependent gate dielectric breakdown
作者:
Chang-Chih ChenAuthor Vitae
;
Taizhi LiuAuthor Vitae
;
Soonyoung ChaAuthor Vitae
;
Linda
Milor
;
linda
.
milor
@ece.gatech.edu" class="auth_mail" title="E-mail the corresponding author
Author Vitae
关键词:
Microprocessor
;
Modeling
;
Timing analysis
;
Cache
;
Gate oxide breakdown
;
Time-dependent dielectric breakdown
刊名:Microprocessors and Microsystems
出版年:2015
2.
AVERT: An elaborate model for simulating variable retention time in DRAMs
作者:
Dae-Hyun Kim
;
dhkim@gatech.edu" class="auth_mail" title="E-mail the corresponding author
;
Soonyoung Cha
;
Linda
S.
Milor
关键词:
DRAM
;
Variable retention time
;
Simulation
;
Modeling
;
Random telegraph noise
刊名:Microelectronics Reliability
出版年:2015
3.
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown
作者:
Taizhi Liu
;
Chang-Chih Chen
;
Soonyoung Cha
;
Linda
Milor
关键词:
BTI
;
HCI
;
GOBD
;
Variation-aware
刊名:Microelectronics Reliability
出版年:2015
4.
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems
作者:
Taizhi Liu
;
taizhiliu88@gatech.edu" class="auth_mail" title="E-mail the corresponding author
;
Chang-Chih Chen
;
Woongrae Kim
;
Linda
Milor
关键词:
Comprehensive reliability analysis
;
SRAM reliability
;
Microprocessor system
;
FEOL
;
BEOL
刊名:Microelectronics Reliability
出版年:2015
5.
The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system
作者:
Soonyoung Cha
;
scha31@gatech.edu" class="auth_mail" title="E-mail the corresponding author
;
Dae-Hyun Kim
;
Taizhi Liu
;
Linda
S.
Milor
关键词:
Bias temperature instability (BTI)
;
Gate oxide breakdown (GOBD)
;
System-level reliability
;
System-level modeling
刊名:Microelectronics Reliability
出版年:2015
6.
Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs
作者:
Dae-Hyun Kim
;
dhkim@gatech.edu" class="auth_mail" title="E-mail the corresponding author
;
Soonyoung Cha
;
Linda
S.
Milor
关键词:
Embedded DRAM
;
Built-in self-test
;
Bias temperature instability
;
Hot-carrier injection
;
Gate oxide breakdown
刊名:Microelectronics Reliability
出版年:2015
7.
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis
作者:
Chang-Chih Chen
;
Fahad Ahmed
;
Linda
Milor
刊名:Microelectronics Reliability
出版年:2013
8.
Backend dielectric reliability simulator for microprocessor system
作者:
Chang-Chih Chen
;
Fahad Ahmed
;
Dae Hyun Kim
;
Sung Kyu Lim
;
Linda
Milor
刊名:Microelectronics Reliability
出版年:2012
9.
Impact of irregular geometries on low-k dielectric breakdown
作者:
Muhammad
;
Bashir
;
Linda
;
Milor
;
;
;
linda
.
milor
@ece.gatech.edu
;
Dae Hyun
;
Kim
;
Sung Kyu
;
Lim
刊名:Microelectronics Reliability
出版年:2011
10.
Via wearout detection with on-chip monitors
作者:
Fahad Ahmed
;
Linda
Milor
关键词:
Electromigration
;
Built-in self-test
;
Reliability monitor
刊名:Microelectronics Journal
出版年:2010
1
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