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内部出版物
在“
Elsevier电子期刊
”中,
命中:
11
条,耗时:小于0.01 秒
1.
Identification of ELF3 as an early transcriptional regulator of human urothelium
作者:
Matthias B枚ck
;
Jennifer Hinley
;
Constanze Schmitt
;
Tom
Wahlich
t
;
Stefan Kramer
;
Jennifer Southgate
关键词:
Differentiation
;
Normal Human Urothelium
;
Microarray analysis
;
Time series
;
Gene expression
;
ELF3
;
PPAR纬
刊名:Developmental Biology
出版年:15 February, 2014
2.
Meeting commentary¡ª¡°Medicines for older adults: Learning from practice to develop patient centric drug products¡±
作者:
John
Wahlich
;
Sven Stegemann
;
Mine Orlu-Gul
关键词:
Older adult
;
Medicine
;
Adherence
;
Patient-centric
;
Ageing
;
Care
刊名:International Journal of Pharmaceutics
出版年:2013
3.
Modeling and experimental verification of the 300 mm Ar anneal process
作者:
T. Mü
;
ller
;
R.
Wahlich
;
P. Krottenthaler
;
J. Studener
;
A. Kü
;
hhorn and W.v. Ammon
关键词:
Ar anneal process
;
Gravitational induced bending stress
;
Upper yield stress
;
Vertical furnace anneal
;
FEM modeling
刊名:Materials Science and Engineering: B
出版年:2005
4.
169-DOMESTIC VIOLENCE: A NEW, INTER-DISCIPLINARY APPROACH TO SUPPORT WOMEN AND CHILDREN
作者:
Moore-Schmeil
;
C
;
Harms-
Wahlich
;
I
;
Koppelin
;
F
;
Lungershausen
;
M
;
Mü
;
hrel
;
M
刊名:Journal of Psychosomatic Research
出版年:2004
5.
Oxide precipitates in annealed nitrogen-doped 300mm CZ-SI
作者:
Akhmetov
;
V.D.
;
Richter
;
H.
;
Lysytskiy
;
O.
;
Wahlich
;
R.
;
Mü
;
ller
;
T.
关键词:
300mm Silicon
;
Nitrogen doping
;
Precipitates
;
Intrinsic gettering
刊名:Materials Science in Semiconductor Processing
出版年:2002
6.
Mechanical properties of nitrogen-doped CZ silicon crystals
作者:
Orlov
;
V.
;
Richter
;
H.
;
Fischer
;
A.
;
Reif
;
J.
;
Mü
;
ller
;
T.
;
Wahlich
;
R.
关键词:
Silicon
;
Large wafer diameter
;
Upper yield stress
;
Nitrogen doping
刊名:Materials Science in Semiconductor Processing
出版年:2002
7.
Enhancement of gettering efficiencies of different silicon substrates during a 0.18 μm LTB CMOS process simulation –: Stratigraphy by a novel chemical ultra-trace depth-profiling
作者:
Hoelzl
;
R.
;
Fabry
;
L.
;
Range
;
K.-J.
;
Wahlich
;
R.
;
Kissinger
;
G.
关键词:
Gettering efficiency
;
Gettering mechanisms
;
Copper (Cu)
;
Nickel (Ni)
;
Silicon (Si)
;
Low-thermal-budget (LTB) CMOS process
刊名:Microelectronic Engineering
出版年:2001
8.
Upper yield point of large diameter silicon
作者:
Fischer
;
A.
;
Richter
;
H.
;
Shalynin
;
A.
;
Krottenthaler
;
P.
;
Obermeier
;
G.
;
Lambert
;
U.
;
Wahlich
;
R.
关键词:
Silicon
;
Large wafer diameter
;
Upper yield stress
;
Multiple slip
;
Oxygen
1
刊名:Microelectronic Engineering
出版年:2001
9.
Mechanical strength of 300 mm diameter silicon wafers at high temperatures: modeling and simulation
作者:
Fischer
;
A.
;
Grabolla
;
Th.
;
Richter
;
H.
;
Obermeier
;
G.
;
Krottenthaler
;
P.
;
Wahlich
;
R.
关键词:
Large silicon wafers
;
Mechanical strength
;
Modeling and simulation
刊名:Microelectronic Engineering
出版年:1999
10.
Dependence of Gate Oxide Integrity on Grown-In Defect Density in Czochralski Grown Silicon
作者:
Lambert
;
U.
;
Huber
;
A.
;
Grabmeier
;
J.
;
Obermeier
;
G.
;
Vanhellemont
;
J.
;
Wahlich
;
R.
;
Kissinger
;
G.
刊名:Microelectronic Engineering
出版年:1999
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