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CNKI期刊论文0611(15)
标准(2)
在“
Elsevier电子期刊
”中,
命中:
984
条,耗时:0.0229896 秒
在所有数据库中总计命中:
17,796
条
1.
Doping of
semiconductor
s by molecular monolayers: monolayer formation, dopant diffusion and applications
作者:
Liang Ye
a
;
b
;
Michel P. de Jong
b
;
Tibor Kudernac
a
;
Wilfred G. van der Wiel
b
;
Jurriaan Huskens
a
;
j.huskens@utwente.nl" class="auth_mail" title="E-mail the corresponding author
关键词:
Monolayer doping
;
Silicon
;
Germanium
;
Group III-V
semiconductor
s
;
Dopant
;
Transistor
刊名:Materials Science in
Semiconductor
Processing
出版年:2017
2.
Best Practice Sharing for Complexity Management in Supply Chains of the
Semiconductor
Industry
作者:
Can Sun
a
;
b
;
can.sun@infineon.com" class="auth_mail" title="E-mail the corresponding author
;
Thomas Rose
a
;
c
;
Hans Ehm
b
;
Tobias Herbig
d
关键词:
Complex System
;
Complexity Drivers
;
Complexity Reduction
;
Supply Chain Management
;
Semiconductor
Industry
刊名:Procedia CIRP
出版年:2016
3.
A robust method to determine the contact resistance using the van der Pauw set up
作者:
G. Gonzá
;
lez-Dí
;
az
;
germang@ucm.es
;
D. Pastor
;
E. Garcí
;
a-Hemme
;
D. Montero
;
R. Garcí
;
a-Hernansanz
;
J. Olea
;
A. del Prado
;
E. San André
s ;
I. Má
;
rtil
关键词:
van der Pauw
;
Sheet resistance
;
Contacts
;
Resistivity
;
PSPICE
刊名:Measurement
出版年:2017
4.
Tuning the tunneling probability by mechanical stress in Schottky barrier based reconfigurable nanowire transistors
作者:
Tim Baldauf
a
;
Tim.Baldauf@namlab.com
;
André
;
Heinzig
a
;
Jens Trommer
b
;
Thomas Mikolajick
a
;
b
;
Walter Michael Weber
a
;
b
关键词:
Silicon nanowire
;
Reconfigurable logic
;
CMOS
;
RFET
;
SBFET
;
Tunneling
;
Schottky junction
;
Stress
;
Strain
;
Symmetry
;
Deformation potential
;
Self-limited oxidation
;
Simulation
;
TCAD
刊名:Solid-State Electronics
出版年:2017
5.
Arsine gas sensor based on gold-modified reduced graphene oxide
作者:
Ryo FurueAuthor Vitae
;
Edwin P. KovekeAuthor Vitae
;
Shotaro SugimotoAuthor Vitae
;
Yuta ShudoAuthor Vitae
;
Shinya HayamiAuthor Vitae
;
Shin-Ichi OhiraAuthor Vitae
;
Kei Toda
;
todakei@sci.kumamoto-u.ac.jp
Author Vitae
关键词:
Arsine
;
Gold
;
Reduced graphene oxide
;
Gas sensor
刊名:Sensors and Actuators B: Chemical
出版年:2017
6.
Feature Construction for Dense Inline Data in
Semiconductor
Manufacturing Processes
作者:
Asad A. Ul Haq
*
;
asadulhaq@utexas.edu
;
Keren Wang
**
;
wangkeren@utexas.edu
;
Dragan Djurdjanovic
***
;
dragand@me.utexas.edu
关键词:
Feature construction
;
Data reduction
;
Semiconductor
manufacturing
;
Quality control
;
Manufacturing processes
;
Process control
刊名:IFAC-PapersOnLine
出版年:2016
7.
Virtual Metrology Concept for Predicting Defect Levels in
Semiconductor
Manufacturing
作者:
A. Ul Haq
;
asadulhaq@utexas.edu
;
D. Djurdjanovic
关键词:
Virtual Metrology
;
Quality Control
;
Defect Levels
;
Semiconductor
Manufacturing
刊名:Procedia CIRP
出版年:2016
8.
Towards proactive maintenance actions scheduling in the
Semiconductor
Industry
(SI) using Bayesian approach
作者:
Anis Ben Said
*
;
**
;
anis.bensaid@st.com" class="auth_mail" title="E-mail the corresponding author
;
Muhammad-Kashif Shahzad
**
;
muhammadkashif.shahzad@g-scop.inpg.fr" class="auth_mail" title="E-mail the corresponding author
;
Eric Zamai
**
;
eric.zamai@grenoble-inp.fr" class="auth_mail" title="E-mail the corresponding author
;
Stephane Hubac
*
;
stephane.hubac@st.com" class="auth_mail" title="E-mail the corresponding author
;
Michel Tollenaere
**
;
michel.tollenaere@grenoble-inp.fr" class="auth_mail" title="E-mail the corresponding author
关键词:
Maintenance actions guidance
;
unscheduled maintenance duration
;
Bayesian network
;
FDC
;
maintenance procedure
刊名:IFAC-PapersOnLine
出版年:2016
9.
Institutional support, innovation capabilities and exports: Evidence from the
semiconductor
industry
in Taiwan
作者:
Rajah Rasiah
a
;
rajah@um.edu.my" class="auth_mail" title="E-mail the corresponding author
Author Vitae
;
Rafat Beigpoor Shahrivar
a
;
beigpours@um.edu.my" class="auth_mail" title="E-mail the corresponding author
Author Vitae
;
Xiao-Shan Yap
b
;
xiaoshan.yap@eawag.ch" class="auth_mail" title="E-mail the corresponding author
Author Vitae
关键词:
Institutional support
;
Innovation capabilities
;
Exports
;
Semiconductor
firms
;
Taiwan
刊名:Technological Forecasting & Social Change
出版年:2016
10.
Identifying airborne metal particles sources near an optoelectronic and
semiconductor
industrial park
作者:
Ho-Wen Chen
a
;
Wei-Yea Chen
a
;
Cheng-Nan Chang
a
;
Yen-Hsun Chuang
a
;
Yu-Hao Lin
b
;
11844@yahoo.com.tw" class="auth_mail" title="E-mail the corresponding author
关键词:
High-tech
industry
;
Trace heavy metal
;
Airborne particles
;
Element mass size distributions
;
Micro-orifice uniform deposit impactor (MOUDI)
刊名:Atmospheric Research
出版年:2016
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