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在“Elsevier电子期刊”中，命中：209条，耗时：0.0239622 秒

在所有数据库中总计命中：1,313条

1.A theoretical analysis and determination of the technical requirements for a Bragg diffraction-based cold atom interferometry gravimeter

作者：Qingqing Hu^a ; ^b ; ^{qingqinghu@nudt.edu.cn} ; Jun Yang^a ; ^b ; ^{jyang@nudt.edu.cn} ; Yukun Luo^a ; ^b ; Aiai Jia^a ; ^b ; Chunhua Wei^a ; ^b ; Zehuan Li^a ; ^b

关键词：Cold atom interferometry ; Gravimeter ; nth order Bragg diffraction ; Large momentum transfer

刊名：Optik - International Journal for Light and Electron Optics

出版年：2017

2.Highly sensitive optical interferometric technique reveals stress-dependent instantaneous nanometric growth fluctuations of Chinese chive leaf under heavy metal stress

作者：Kokge Thilini Kanchana Muthumali DeSilva^a ; ^b ; Uma Maheswari Rajagopalan^c ; Hirofumi Kadono^a ; ^{kadono@mail.saitama-u.ac.jp}

关键词：ANSD ; Average normalized standard deviation ; CAT ; Catalase ; CCD ; Charge-coupled device ; H2O2 ; Hydrogen peroxide ; ICP-AES ; Inductively coupled plasma- atomic emission spectrometry ; NIF ; Nanometric intrinsic fluctuation ; POD ; Peroxidase ; RER ; Relative elongation rate ; ROS ; Reactive oxygen species ; SD ; Standard deviation ; SIT ; Statistical interferometry technique ; SOD ; Super oxide dismutase

刊名：Ecotoxicology and Environmental Safety

出版年：2017

3.Representation-free description of light-pulse atom interferometry including non-inertial effects

作者：Stephan Kleinert^a ; ^{stephan.kleinert@uni-ulm.de" class="auth_mail" title="E-mail the corresponding author} ; Endre Kajari^a ; Albert Roura^a ; Wolfgang P. Schleich^a ; ^b

关键词：Atom interferometry ; Quantum optics

刊名：Physics Reports

出版年：2015

4.Geometric phase of an accelerated two-level atom in the presence of a perfectly reflecting plane boundary

作者：Hua Zhai^a ; Jialin Zhang^a ; ^{jialinzhang@hunnu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Hongwei Yu^a ; ^b ; ^{hwyu@hunnu.edu.cn" class="auth_mail" title="E-mail the corresponding author}

关键词：Geometric phase ; Unruh effect ; Open quantum systems

刊名：Annals of Physics

出版年：2016

5.Hydrofluoric acid etching of dental zirconia. Part 1: etching mechanism and surface characterization

作者：Quentin Flamant^a ; ^b ; ^{quentin.flamant@upc.edu" class="auth_mail" title="E-mail the corresponding author} ; Fernando Garcí ; a Marro^a ; ^b ; Joan Josep Roa Rovira^a ; ^b ; Marc Anglada^a ; ^b ; ^{marc.j.anglada@upc.edu" class="auth_mail" title="E-mail the corresponding author}

关键词：AFM ; atomic force microscopy ; DI water ; deionized water ; EDS ; energy dispersive spectrometry ; ESI-FTMS ; electrospray ionization Fourier transform mass spectrometry ; HF ; hydrofluoric acid ; SEM ; scanning electron microscopy ; SRC ; smooth&ndash ; rough crossover ; TEM ; Transmission electron microscopy ; WLI ; white light interferometry ; XPS ; X-ray photoelectron spectroscopy ; Y-TZP ; Yttria-stabilized tetragonal zirconia polycrystals ; 3Y-TZP ; 3 ; mol% Y-TZP

刊名：Journal of the European Ceramic Society

出版年：2016

6.Selective etching of injection molded zirconia-toughened alumina: Towards osseointegrated and antibacterial ceramic implants

作者：Quentin Flamant^a ; ^b ; ^{quentin.flamant@upc.edu" class="auth_mail" title="E-mail the corresponding author} ; Carlos Caravaca^c ; Sylvain Meille^c ; Laurent Gremillard^c ; Jé ; rô ; me Chevalier^c ; Katia Biotteau-Deheuvels^d ; Meinhard Kuntz^d ; Rona Chandrawati^e ; ¹ ; Inge K. Herrmann^e ; ² ; Christopher D. Spicer^e ; Molly M. Stevens^e ; Marc Anglada^a ; ^b ; ^{marc.j.anglada@upc.edu" class="auth_mail" title="E-mail the corresponding author}

关键词：AFM ; atomic force microscopy ; DPPC ; 1 ; 2-dipalmitoyl-sn-glycero-3-phosphocholine ; FE ; finite elements ; FIB ; Focused Ion Beam ; HCl ; hydrochloric acid ; HF ; hydrofluoric acid ; LTD ; low temperature degradation ; OPA ; o-phtaldialdehyde ; PBS ; phosphate buffered saline ; SEM ; scanning electron microscopy ; WLI ; white light interferometry ; XPS ; X-ray photoelectron spectroscopy ; Y-TZP ; Yttria-stabilized tetragonal zirconia polycrystal ; ZTA ; Zirconia toughened alumina

刊名：Acta Biomaterialia

出版年：2016

7.Strain/composition interplay in thin SiGe layers on insulator processed by Ge condensation

作者：Victor Boureau^a ; ^b ; Daniel Benoit^b ; Bé ; né ; dicte Warot^a ; Martin Hÿ ; tch^a ; Alain Claverie^a ; ^{alain.claverie@cemes.fr" class="auth_mail" title="E-mail the corresponding author}

关键词：Germanium condensation process ; Strain ; Electron interferometry

刊名：Materials Science in Semiconductor Processing

出版年：2016

8.Electrophoretic deposition of multilayered (cubic and tetragonal stabilized) zirconia ceramics for adapted crack deflection

作者：Rolf Zehbe^a ; ^{zehbe@uni-potsdam.de" class="auth_mail" title="E-mail the corresponding author} ; ^{rolf.zehbe@gmx.de" class="auth_mail" title="E-mail the corresponding author} ; Carolina Mochales^b ; Daniela Radzik^c ; Wolf-Dieter Mü ; ller^b ; Claudia Fleck^d

关键词：Electrophoretic deposition ; Yttria stabilized zirconia ; Transformation toughening ; Multilayer ; Crack deflection

刊名：Journal of the European Ceramic Society

出版年：2016

9.Surface Characterization, Material Removal Mechanism and Material Migration Study of Micro EDM Process on Conductive SiC

作者：Krishna Kumar Saxena^a ; Sanjay Agarwal^b ; ^{sanjay72ag@rediffmail.com" class="auth_mail" title="E-mail the corresponding author} ; Sanchit Kumar Khare^b

关键词：EDM ; Micro EDM ; SiC ; material removal ; material migration

刊名：Procedia CIRP

出版年：2016

10.An optimized nano-positioning stage for Bristol’s Transverse Dynamic Force Microscope

作者：G. De Silva^* ; S.C. Burgess^* ; T. Hatano^* ; S.G. Khan^* ; K. Zhang^* ; T. Nguyen^*** ; G. Herrmann^* ; ^{G.Herrmann@bris.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; C. Edwards^*** ; ^{C.Edwards@exeter.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; M. Miles^**

关键词：x-y Stage ; Force Microscope ; Micro-/Nanosystems ; Multi-Disciplinary Modelling ; Motion Control

刊名：IFAC-PapersOnLine

出版年：2016

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