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在“Elsevier电子期刊”中，命中：5条，耗时：小于0.01 秒

1.Determination of band offset in MgO/InP heterostructure by X-ray photoelectron spectroscopy

作者：Xue Liu^a ; Xiaohua Wang^a ; ^{biewang2001@126.com" class="auth_mail" title="E-mail the corresponding author} ; Dengkui Wang^a ; Jilong Tang^a ; ^{jl_tangcust@163.com" class="auth_mail" title="E-mail the corresponding author} ; Xuan Fang^a ; Dan Fang^a ; Yongfeng Li^b ; ^c ; Bin Yao^b ; ^c ; Xiaohui Ma^a ; Haizhu Wang^a ; Zhipeng Wei^a

关键词：MgO/InP ; Thin film ; Heterostructure ; Band offset ; Atomic layer deposition

刊名：Vacuum

出版年：2016

2.Disordering and annealing effects of magnesium aluminate spinel implanted with high-flux 60 keV Cu⁻

作者：Lee ; C.G. ; Takeda ; Y. ; Kishimoto ; N.

关键词：High-flux implantation ; Magnesium aluminate spinel ; Lattice disorder ; RBS

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2002

3.Microstructural and electrical properties of MgO thin films grown on p-InP (100) substrates at low temperature

作者：Kim ; T.W. ; You ; Y.S.

关键词：81.15.Gh ; 68.55.-a ; 68.55.Ce ; MgO/p-InP ; Metal&ndash ; insulator&ndash ; semiconductor (MIS) ; Transmission electron microscopy (TEM)

刊名：Applied Surface Science

出版年：2001

4.Structure and dispersion of supported-vanadia catalysts. Influence of the oxide carrier

作者：Arena ; F. ; Frusteri ; F. ; Parmaliana ; A.

关键词：V₂O₅ catalysts ; Oxide carriers ; TPR&ndash ; HTOC characterisation ; Surface V structures ; V₂O₅ dispersion ; V₂O₅ reducibility

刊名：Applied Catalysis A: General

出版年：1999

5.Crystallographic orientation and morphology of epitaxial In₂O₃ thin films grown on MgO(001) single crystal substrates

作者：Sieber ; H. ; Senz ; St. ; Hesse ; D.

关键词：MgO ; In₂O₃ ; Epitaxial thin films ; Film morphology ; Transmission electron microscopy ; X-ray diffraction

刊名：Thin Solid Films

出版年：1997

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