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CNKI学位论文(1064)
CNKI期刊论文0611(1)
知网期刊论文(258)
在“
Elsevier电子期刊
”中,
命中:
711
条,耗时:0.0519753 秒
在所有数据库中总计命中:
1,323
条
1.
Modeled optical properties of
SiGe
and Si layers compared to spectroscopic ellipsometry measurements
作者:
C. Kriso
a
;
F. Triozon
b
;
c
;
francois.triozon@cea.fr
;
C. Delerue
d
;
L. Schneider
a
;
F. Abbate
a
;
E. Nolot
b
;
c
;
D. Rideau
a
;
Y.-M. Niquet
e
;
c
;
G. Mugny
a
;
C. Tavernier
a
关键词:
Simulation
;
Thin
silicon
film
s
;
SiGe
;
Optical response
;
Ellipsometry
刊名:Solid-State Electronics
出版年:2017
2.
Surfactant-mediated epitaxy of
thin
germanium
film
s on
SiGe
(001) virtual substrates
作者:
J. Schmidt
a
;
schmidt@mbe.uni-hannover.de
;
D. Tetzlaff
a
;
E. Bugiel
a
;
T.F. Wietler
a
;
b
关键词:
A1. Surface morphology
;
A3. Molecular beam epitaxy
;
A3. Surfactant mediated epitaxy
;
B1. Germanium silicon alloys
;
B2. Strained Ge
;
B2. Virtual substrates
刊名:Journal of Crystal Growth
出版年:2017
3.
Ge-rich
SiGe
thin
film
deposition by co-sputtering in in-situ and ex-situ solid phase crystallization for photovoltaic applications
作者:
S.A. Shahahmadi
a
;
A. Aizan Zulkefle
a
;
A.K.M. Hasan
a
;
S.M. Rana
c
;
B. Bais
b
;
M. Akhtaruzzaman
a
;
A.R.M. Alamoud
c
;
N. Amin
a
;
b
;
c
;
关键词:
SiGe
thin
film
s
;
Co-sputtering
;
Annealing
;
Properties of
SiGe
刊名:Materials Science in Semiconductor Processing
出版年:2016
4.
Improvement of hydrogenated amorphous silicon germanium
thin
film
solar cells by different p-type contact layer
作者:
Jaehyun Cho
a
;
1
;
Duy Phong Pham
b
;
1
;
Junhee Jung
a
;
Chonghoon Shin
a
;
Jinjoo Park
b
;
Sangho Kim
a
;
Anh Huy Tuan Le
b
;
Hyeongsik Park
b
;
S.M. Iftiquar
b
;
Junsin Yi
a
;
b
;
yi@yurim.skku.ac.kr" class="auth_mail" title="E-mail the corresponding author
关键词:
a-
SiGe
;
H
thin
film
solar cells
;
Hydrogenated microcrystalline silicon oxide
;
p-type contact layer
刊名:Materials Science in Semiconductor Processing
出版年:2016
5.
Berkovich nanoindentation on single
SiGe
epitaxial
film
s
作者:
Derming Lian
;
lianderming@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
Pei Li Lin
关键词:
Thin
film
s
;
Vapor deposition
;
Defect
刊名:Microelectronics Reliability
出版年:2016
6.
Band engineering of amorphous silicon ruthenium
thin
film
and its near-infrared absorption enhancement combined with nano-holes pattern on back surface of silicon substrate
作者:
Anran Guo
a
;
Hao Zhong
a
;
Wei Li
a
;
wli@uestc.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
wli1123@yeah.net" class="auth_mail" title="E-mail the corresponding author
;
Deen Gu
b
;
Xiangdong Jiang
b
;
Yadong Jiang
a
关键词:
A-Si1-xRux
thin
film
s
;
Bandgap
;
Near-infrared
;
Nano-holes
;
Light absorption
刊名:Applied Surface Science
出版年:2016
7.
Simulation, fabrication, and application of transparent conductive Mo-doped ZnO
film
in a solar cell
作者:
Yanfeng Wang
a
;
b
;
Xiaodan Zhang
a
;
xdzhang@nankai.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Xudong Meng
b
;
Yu Cao
a
;
c
;
Fu Yang
b
;
Jingyu Nan
b
;
Qinggong Song
d
;
Qian Huang
a
;
Changchun Wei
a
;
Jianjun Zhang
a
;
Ying Zhao
a
关键词:
Mo-doped ZnO (MZO)
film
;
First-principles calculations
;
Magnetron sputtering
;
Thin
-
film
solar cells
刊名:Solar Energy Materials and Solar Cells
出版年:2016
8.
On the use of MEIS cartography for the determination of Si
1-x
Ge
x
thin
-
film
strain
作者:
T.S. Avila
;
silva.avila@ufrgs.br" class="auth_mail" title="E-mail the corresponding author
;
P.F.P. Fichtner
;
A. Hentz
;
P.L. Grande
关键词:
Ion beam analysis
;
SiGe
;
blocking
刊名:
Thin
Solid
Film
s
出版年:2016
9.
Back reflectors with periodic gratings for light trapping in a-
SiGe
:H solar cells
作者:
C. Ducros
;
cedric.ducros@cea.fr
;
H. Szambolics
;
F. Emieux
;
A. Pereira
关键词:
Thin
film
solar cell
;
Light trapping
;
Textured back reflector
;
a-
SiGe
H
刊名:
Thin
Solid
Film
s
出版年:2016
10.
Self Focusing SIMS: Probing
thin
film
composition in very confined volumes
作者:
Alexis Franquet
a
;
alexis.franquet@imec.be" class="auth_mail" title="E-mail the corresponding author
;
Bastien Douhard
a
;
Davit Melkonyan
a
;
b
;
Paola Favia
a
;
Thierry Conard
a
;
Wilfried Vandervorst
a
;
b
关键词:
Self Focusing SIMS
;
Atom Probe Tomography
;
SiGe
;
Quantification
;
Small volumes
;
Lateral resolution
刊名:Applied Surface Science
出版年:2016
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