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馆藏期刊(1)
CNKI学位论文(65)
知网期刊论文(87)
在“
Elsevier电子期刊
”中,
命中:
6
条,耗时:小于0.01 秒
在所有数据库中总计命中:
153
条
1.
Synthesis and electrochemical characterization of stoichiometric Cu
2
S as cathode material with high rate capability for rechargeable lithium batteries
作者:
Gulnur Kalimuldina
a
;
Izumi Taniguchi
b
;
taniguchi.i.aa@m.titech.ac.jp" class="auth_mail" title="E-mail the corresponding author
关键词:
Cu2S
;
Spray pyrolysis
;
Rechargeable lithium batteries
;
Cathode materials
;
Reaction mechanism
刊名:Journal of Power Sources
出版年:2016
2.
Customer integration within service development¡ªA review of methods and an analysis of insitu and
exsitu
contributions
作者:
Bo Edvardsson
1
;
bo.edvardsson@kau.se
;
Per Kristensson
2
;
per.kristensson@kau.se
;
Peter Magnusson
3
;
peter.magnusson@kau.se
;
Erik Sundströ
;
m
;
erik.sundstrom@kau.se
关键词:
Customer integration
;
Service development
;
Customer involvement
;
Customer information
;
insitu&ndash
;
exsitu
刊名:Technovation
出版年:2012
3.
UHV-ERDA investigation of NEG coatings
作者:
M. Bender
;
H. Kollmus
;
M.C. Bellachioma
;
W. Assmann
关键词:
ERDA
;
Elastic recoil detection analysis
;
NEG
;
Non-evaporable getter
;
UHV
;
Ultra high vacuum
;
Ti–
;
Zr–
V
刊名:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
出版年:2010
4.
Stacking of multilayer InAs quantum dots with combination capping of InAlGaAs and high temperature grown GaAs
作者:
J. Suseendran
;
N. Halder
;
S. Chakrabarti
;
T.D. Mishima
;
C.R. Stanley
关键词:
MBE
;
Multilayer QDs
;
RHEED
;
XTEM
刊名:Superlattices and Microstructures
出版年:2009
5.
Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001)
作者:
Ö
;
zcan
;
A.S.
;
Ludwig
;
Jr
;
K.F.
;
Lavoie
;
C.
;
Basu
;
S.N.
;
Coia
;
C.
;
Cabral
;
Jr
;
C.
;
Rodbell
;
K.P.
;
et. al.
关键词:
Silicides
;
Titanium
;
X-Ray diffraction
;
Texture
刊名:Thin Solid Films
出版年:2004
6.
X-ray photoelectron spectroscopy characterisation of high-k dielectric Al
2
O
3
and HfO
2
layers deposited on SiO
2
/Si surface
作者:
Vitchev
;
R.G.
;
Pireaux
;
J.J.
;
Conard
;
T.
;
Bender
;
H.
;
Wolstenholme
;
J.
;
Defranoux
;
Chr.
关键词:
77.55.+f
;
79.60.&minus
j ;
High-k
;
XPS
刊名:Applied Surface Science
出版年:2004
1
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