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CNKI会议论文(5)
CNKI学位论文(1758)
知网期刊论文(571)
在“
Elsevier电子期刊
”中,
命中:
443
条,耗时:小于0.01 秒
在所有数据库中总计命中:
2,334
条
1.
Study of narrow and intense UV electroluminescence from ITO/SRO/Si-p and ITO/SRN/SRO/Si-p based light emitting
capacitors
作者:
S.A. Cabañ
;
as-Tay
a
;
scabanastay@hotmail.com
;
L. Palacios-Huerta
b
;
M. Aceves-Mijares
b
;
A. Coyopol
c
;
F. Morales-Morales
a
;
S.A. Pé
;
rez-Garcí
;
a
a
;
L. Licea-Jimé
;
nez
a
;
C. Domí
;
nguez-Horna
d
;
K. Monfil-Leyva
c
;
A. Morales-Sá
;
nchez
a
;
alfredo.morales@cimav.edu.mx
关键词:
UV electroluminescence
;
Resistive switching
;
Silicon-rich oxide
;
Silicon-rich nitride
;
Indium tin oxide
刊名:Journal of Luminescence
出版年:2017
2.
Characterization of CdS and AgPt nanofillers used in organic
capacitors
作者:
Mohammad Y. Al-Haik
a
;
mohaik@vt.edu
;
Yousef Haik
b
;
Muhammad R. Hajj
a
关键词:
Organic capacitor
;
Storage device
;
Charge transfer
;
Conductive nanoparticles
;
Conducting polymer
刊名:Synthetic Metals
出版年:2017
3.
Electrical, optical, structural and chemical properties of Al
2
TiO
5
films for high-к gate dielectric applications
作者:
Suresh Addepalli
a
;
b
;
suresh181083@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
Lakshmi Ganapathi Kolla
b
;
klganapathi@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
Uthanna Suda
a
;
uthanna@rediffmail.com" class="auth_mail" title="E-mail the corresponding author
关键词:
Al2TiO5 thin films
;
Magnetron sputtering
;
Structure
;
Dielectric constant
;
Optical properties
刊名:Materials Science in
Semiconductor
Processing
出版年:2017
4.
On the correlation of growth, structural and electrical properties of epitaxial Ge grown on Si by solid source molecular beam epitaxy
作者:
Sudipta Das
a
;
Krista R. Khiangte
b
;
Rajveer S. Fandan
a
;
Jaswant S. Rathore
b
;
Ravindra S. Pokharia
a
;
Suddhasatta Mahapatra
b
;
Apurba Laha
a
;
laha@ee.iitb.ac.in
关键词:
Epitaxial Ge
;
MBE
;
CMOS
;
Photodetector
刊名:Current Applied Physics
出版年:2017
5.
Transport mechanisms of leakage current in Al
2
O
3
/InAlAs MOS
capacitors
作者:
Chengji Jin
;
Hongliang Lu
;
hllv@mail.xidian.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Yimen Zhang
;
Yuming Zhang
;
He Guan
;
Lifan Wu
;
Bin Lu
;
Chen Liu
关键词:
Metal&ndash
;
oxide&ndash
;
semiconductor
capacitors
;
Leakage current
;
Schottky emission
;
Frenkel&ndash
;
Poole emission
刊名:Solid State Electronics
出版年:2016
6.
Deep electron traps in HfO
2
-based metal-oxide-
semiconductor
capacitors
作者:
L. Sambuco Salomone
a
;
lucas.iss@gmail.com" class="auth_mail" title="E-mail the corresponding author
;
J. Lipovetzky
a
;
b
;
S.H. Carbonetto
a
;
M.A. Garcí
;
a Inza
a
;
E.G. Redin
a
;
F. Campabadal
c
;
A. Faigó
;
n
a
;
b
关键词:
Hafnium oxide
;
Atomic layer deposition
;
Electrical characterization
;
Modeling
;
Capacitors
刊名:Thin Solid Films
出版年:2016
7.
Real-time and on-site γ-ray radiation response testing system for
semiconductor
devices and its applications
作者:
Yifei Mu
a
;
Y.Mu@student.liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
;
Ce Zhou Zhao
b
;
cezhou.zhao@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Yanfei Qi
b
;
yanfei.qi01@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Sang Lam
b
;
s.lam@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Chun Zhao
c
;
garyzhao@ust.hk" class="auth_mail" title="E-mail the corresponding author
;
Qifeng Lu
a
;
qifeng@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
;
Yutao Cai
b
;
yutao.cai@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Ivona Z. Mitrovic
a
;
ivona@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
;
Stephen Taylor
a
;
s.taylor@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
;
Paul R. Chalker
d
;
pchalker@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author
关键词:
On-site radiation response
;
Real-time I&ndash
;
V/C&ndash
;
V test
;
High-κ dielectrics
;
Total-dose induced defects
;
HfO2
刊名:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
出版年:2016
8.
The investigation of dielectric properties and ac conductivity of Au/GO-doped PrBaCoO nanoceramic/n-Si
capacitors
using impedance spectroscopy method
作者:
A. Kaya
a
;
ahmetkaya0107@hotmail.com.tr" class="auth_mail" title="E-mail the corresponding author
;
S. Alialy
b
;
S. Demirezen
b
;
M. Balbaşı
c
;
S.A. Yerişkin
c
;
A. Aytimur
d
关键词:
C. Dielectric properties
;
Au/GO-doped PrBaCoO nanoceramic/n-Si capacitor
;
Impedance spectroscopy
;
Complex modulus and electrical conductivity
刊名:Ceramics International
出版年:2016
9.
Low-temperature growth and characterization of neodymium-substituted bismuth titanate nanowires in a highly ordered anodic aluminum oxide template by an AC electrodeposition method on the platinum substrate for ferroelectric applications
作者:
V. Selvamurugan
a
;
G. Mangamma
b
;
S. Ravi
a
;
M. Kamruddin
b
;
D. Madhavan
c
;
A. Marikani
a
;
amari@mepcoeng.ac.in" class="auth_mail" title="E-mail the corresponding author
关键词:
A. Sol&ndash
;
gel process
;
C. Ferroelectric properties
;
E.
Capacitors
;
B. X-ray methods
;
E. Substrates
刊名:Ceramics International
出版年:2016
10.
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-
semiconductor
capacitor
作者:
Soshi Sato
a
;
sato.soshi@cies.tohoku.ac.jp" class="auth_mail" title="E-mail the corresponding author
;
Kikuo Yamabe
b
;
Tetsuo Endoh
a
;
c
;
d
;
Masaaki Niwa
a
关键词:
Silicon carbide
;
TDDB
;
Concaves
;
Decomposition
;
Normal freezing
;
Graphite
刊名:Microelectronics Reliability
出版年:2016
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