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在“
SpringerLink电子期刊
”中,
命中:
54
条,耗时:0.0779569 秒
在所有数据库中总计命中:
145
条
1.
AUDITOR: A Stage-Wise Soft-Error Detection Scheme for Flip-flop Based Pipelines
关键词:
Soft
;
error detection
;
Flip
;
flop based pipelines
;
Reliability
刊名:Lecture Notes in Computer Science
出版年:2017
2.
Experimental characterization of the bipolar effect on P-hit
single
-
event
transient
s in 65 nm twin-well and triple-well CMOS technologies
作者:
JianJun Chen
;
Bin Liang
;
YaQing Chi
关键词:
single
event
transient
(
SET
)
;
bipolar effect
;
quantitative characterization
刊名:SCIENCE CHINA Technological Sciences
出版年:2016
3.
Simulation study of N-hit
SET
variation in differential cascade voltage switch logical circuits
作者:
PengCheng Huang (1)
ShuMing Chen (2)
JianJun Chen (1)
ZhenYu Wu (1)
ZhengFa Liang (1)
ChunMei Hu (1)
Bin Liang (1)
BiWei Liu (1)
1. Micro-electronics and Microprocessor Institute
;
College of Computer Science
;
National University of Defense Technology
;
Changsha
;
410073
;
China
2. National Laboratory for Parallel and Distributed Processing
;
College of Computer Science
;
National University of Defense Technology
;
Changsha
;
410073
;
China
关键词:
differential cascade voltage switch logic (DCVSL)
;
single
event
transient
(
SET
)
;
effective collection time
;
pulse feedback feature (PFF)
;
across
;
coupled structure
;
宸垎閫昏緫(DCVSL)
;
鍗曠矑瀛愮灛鎬?
SET
)
;
鏈夋晥鏀堕泦鏃堕棿
;
鑴夊啿鍙嶉鐗规€?PFF)
;
浜ゅ弶鑰﹀悎缁撴瀯
;
022401
刊名:SCIENCE CHINA Information Sciences
出版年:2015
4.
Flip-flops soft error rate evaluation approach considering internal
single
-
event
transient
作者:
RuiQiang Song
;
ShuMing Chen
;
YiBai He
;
YanKang Du
关键词:
soft error rate
;
Monte Carlo
;
internal
SET
;
single
;
event
up
set
;
flip
;
flops
;
062403
刊名:SCIENCE CHINA Information Sciences
出版年:2015
5.
Circuit-Level Simulation of the
Single
Event
Transient
s in an On-Chip Single Event Latchup Protection Switch
作者:
Marko S. Andjelkovi?
;
Vladimir Petrovi?
;
Zoran Stamenkovi?…
关键词:
Single
event
transient
;
Single
event
latchup
;
SPS cell
;
CMOS integrated circuits
;
Circuit
;
level simulation
刊名:Journal of Electronic Testing
出版年:2015
6.
A New Analytical Model of
SET
Latching Probability for Circuits Experiencing
Single
- or Multiple-Cycle Single-
Event
Transient
s
作者:
Hoda Pahlevanzadeh
;
Qiaoyan Yu
关键词:
Soft error
;
Soft error rate (SER)
;
Single
;
event
transient
(
SET
)
;
Single
;
event
up
set
(SEU)
;
Reliability
;
Fault injection
;
Fault tolerance
;
Latch window masking
;
Electrical masking
;
Logical masking
;
SET
latching probability
刊名:Journal of Electronic Testing
出版年:2014
7.
A Novel Built-in Current Sensor for N-WELL
SET
Detection
作者:
H.-B. Wang
;
R. Liu
;
L. Chen
;
J.-S. Bi
;
M.-L. Li
;
Y.-Q. Li
关键词:
Single
event
transient
;
Built
;
in self
;
test
;
Integrated circuit reliability
;
Electrical test
;
Ionizing radiation
刊名:Journal of Electronic Testing
出版年:2015
8.
Analysis of process variations impact on the
single
-
event
transient
quenching in 65 nm CMOS combinational circuits
作者:
TianQi Wang (1)
LiYi Xiao (1)
Bin Zhou (1)
ChunHua Qi (1)
关键词:
single
;
event
transient
(
SET
)
;
parameter variation
;
Monte Carlo simulation
;
quenching effect
;
charge share
刊名:SCIENCE CHINA Technological Sciences
出版年:2014
9.
Mirror image: newfangled cell-level layout technique for
single
-
event
transient
mitigation
作者:
Pengcheng Huang (1)
Shuming Chen (2)
Zhengfa Liang (1)
Jianjun Chen (1)
Chunmei Hu (1)
Yibai He (1)
关键词:
Single
event
transient
(
SET
)
;
Charge sharing
;
Stage
;
by
;
stage structure
;
Mirror image (MI)
;
Cell
;
level hardening
刊名:Chinese Science Bulletin
出版年:2014
10.
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell
作者:
Alexandre Simionovski
;
Rafael G. Vaz
;
Odair L. Gon?alez…
关键词:
Current sensor
;
Bulk
;
BICS
;
Dynamic storage
;
Ionizing radiation
;
Transient
event
detection
;
Total ionizing dose
刊名:Journal of Electronic Testing
出版年:2015
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