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1.
Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory
作者:
Dong
-hwan Lee (1)
Jonghong
Kim (1)
Wonyong
Sung (1)
1.
Department
of
Electrical
and
Computer
Engineering
;
Seoul National University
;
Gwanak-gu
;
Seoul
;
151-744
;
Korea
关键词:
NAND flash memory
;
Signal processing
;
Threshold voltage distribution
;
Cell
;
to
;
cell interference
;
Error correction
刊名:The Journal of VLSI Signal Processing
出版年:2015
1
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2015年(1)
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