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内部出版物
Springer电子图书(1)
SpringerLink电子期刊(37)
ProQuest学位论文(1)
Elsevier电子期刊(12)
在“
SpringerLink电子期刊
”中,
命中:
37
条,耗时:小于0.01 秒
在所有数据库中总计命中:
51
条
1.
Test Planning for Core-based Integrated Circuits under Power Constraints
作者:
Breeta SenGupta
;
Dimitar Nikolov
;
Urban Ingelsson…
关键词:
Test plan
;
Test schedule
;
Test cost
;
Power constraint
;
Stacked integrated circuit
;
JTAG
;
IEEE
1149
.1
;
Boundary scan
刊名:Journal of Electronic Testing
出版年:2017
2.
A New Approach to Model the Effect of Topology on Testing Using Boundary Scan
作者:
Farnaz Fotovatikhah
;
Bahareh Naraghi
;
Fatemeh Tavakoli…
关键词:
On chip network
;
Testing
;
Modelling
;
IEEE
1149
;
Energy
;
Topology
;
Test time
;
FPGA
刊名:Journal of Electronic Testing
出版年:2015
3.
Built-in Self Test Power and Test Time Analysis in On-chip Networks
作者:
Mahdieh Nadi Senejani (1)
Mahdiar Ghadiry (2)
Chia Yee Ooi (1)
Muhammad Nadzir Marsono (1)
1. Faculty of Electrical Engineering
;
Universiti Teknologi Malaysia
;
81310
;
Johor Bahru
;
Johor
;
Malaysia
2. Department of Computer Engineering
;
Islamic Azad University
;
Arak Branch
;
Arak
;
Iran
关键词:
On
;
chip networks
;
Test
;
JTAG
;
Energy
;
Analytical model
;
Built
;
in self test
刊名:Circuits, Systems, and Signal Processing
出版年:2015
4.
Access Port Protection for Reconfigurable Scan Networks
作者:
Rafal Baranowski (1)
Michael A. Kochte (1)
Hans-Joachim Wunderlich (1)
关键词:
Debug and diagnosis
;
Reconfigurable scan network
;
IJTAG
;
IEEE
P1687
;
Secure DFT
;
Hardware security
刊名:Journal of Electronic Testing
出版年:2014
5.
Current State of the Mixed-Signal Test Bus
1149
.4
作者:
Jari Hannu (1)
Juha H?kkinen (2)
Juha-Veikko Voutilainen (2)
Heli Jantunen (1)
Markku Moilanen (2)
关键词:
Mixed signal testing
;
1149
.4
;
Boundary scan
刊名:Journal of Electronic Testing
出版年:2012
6.
Secure JTAG Implementation Using Schnorr Protocol
作者:
Amitabh Das (1)
Jean Da Rolt (2)
Santosh Ghosh (1)
Stefaan Seys (1)
Sophie Dupuis (2)
Giorgio Di Natale (2)
Marie-Lise Flottes (2)
Bruno Rouzeyre (2)
Ingrid Verbauwhede (1)
关键词:
JTAG
;
Secure testing
;
IP protection
;
Secure code and firmware updates
;
Cryptographic circuits
;
Schnorr protocol
;
Elliptic curve cryptography
;
Mutual authentication
刊名:Journal of Electronic Testing
出版年:2013
7.
Component Value Calculations and Characterizations for Measurements in the
IEEE
1149
.4 Environment
作者:
Teuvo Saikkonen and Markku Moilanen
关键词:
IEEE
1149
.4
;
Mixed
;
signal test
;
Loading effect
刊名:Journal of Electronic Testing
出版年:2007
8.
High Speed On-Chip Signal Generation for Debug and Diagnosis
作者:
Tsung-Yen Tsai (1)
Sadok Aouini (1)
Gordon Walter Roberts (1)
关键词:
Analog test
;
Mixed
;
signal test
;
Design
;
for
;
test
;
Built
;
in self
;
test
;
Phase generation
;
Frequency synthesis
;
Sigma
;
data encoding
;
Integrated circuit
;
Phase
;
locked loop
刊名:Journal of Electronic Testing
出版年:2012
9.
Component Value Calculations and Characterizations for Measurements in the
IEEE
1149
.4 Environment
作者:
Teuvo Saikkonen and Markku Moilanen
关键词:
IEEE
1149
.4
;
Mixed
;
signal test
;
Loading effect
刊名:Journal of Electronic Testing
出版年:2007
10.
Methods of Testing Discrete Semiconductors in the
1149
.4 Environment
作者:
Jari Hannu and Markku Moilanen
关键词:
1149
.4
;
Boundary scan
;
Discrete semiconductors
刊名:Journal of Electronic Testing
出版年:2007
1
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