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CNKI学位论文(176)
知网期刊论文(290)
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在“
SpringerLink电子期刊
”中,
命中:
54
条,耗时:0.0209902 秒
在所有数据库中总计命中:
468
条
1.
Three-Dimensional Integrated Circuit (3D IC) Key Technology: Through-
Silicon
Via
(
TSV
)
作者:
Wen-Wei Shen
;
Kuan-Neng Chen
关键词:
Through
;
silicon
via
(
TSV
)
;
Three
;
dimensional integrated circuit (3D IC)
刊名:Nanoscale Research Letters
出版年:2017
2.
Low capacitance and highly reliable blind through-
silicon
-
via
s (
TSV
s) with vacuum-assisted spin coating of polyimide dielectric liners
作者:
YangYang Yan
;
Miao Xiong
;
Bin Liu
;
YingTao Ding…
关键词:
low capacitance
;
through
;
silicon
;
via
s (
TSV
s)
;
polyimide liner
3 ;
D integration
;
vacuum
;
assisted spin coating
;
FEA
刊名:SCIENCE CHINA Technological Sciences
出版年:2016
3.
Application of Self-Assembled Monolayers to the Electroless Metallization of High Aspect Ratio
Via
s for Microelectronics
作者:
R. Bernasconi
;
A. Molazemhosseini
;
M. Cervati
;
S. Armini…
关键词:
Through
silicon
via
s
;
self
;
assembled monolayers
;
nickel
;
phosphorus
;
boron
;
electroless
;
copper
刊名:Journal of Electronic Materials
出版年:2016
4.
Fabrication and shear strength analysis of Sn-3.5Ag/Cu-filled
TSV
for 3D microelectronic packaging
作者:
Ashutosh Sharma
;
Do-Hyun Jung
;
Myong-Hoon Roh
;
Jae Pil Jung
关键词:
through
;
Si
;
via
(
TSV
)
;
electroplating
;
electrolyte
;
microstructure
;
solder
;
reflow
刊名:Electronic Materials Letters
出版年:2016
5.
Low temperature wafer level conformal polymer dielectric spray coating for through
silicon
via
s with 2:1 aspect ratio
作者:
Yuechen Zhuang
;
Daquan Yu
;
Fengwei Dai
;
Zhongcai Niu
刊名:Microsystem Technologies
出版年:2016
6.
High frequency characterization and analysis of through
silicon
via
s and coplanar waveguides for
silicon
interposer
作者:
Huijuan Wang
;
Xiaoli Ren
;
Jing Zhou
;
Cheng Pang…
刊名:Microsystem Technologies
出版年:2016
7.
Study on
TSV
isolation liners for a
Via
Last approach with the use in 3D-WLP for MEMS
作者:
Lutz Hofmann
;
Tobias Fischer
;
Thomas Werner
;
Franz Selbmann…
刊名:Microsystem Technologies
出版年:2016
8.
Pretreatment to assure the copper filling in through-
silicon
via
s
作者:
Wei Luo
;
Junhong Zhang
;
Yi Li
;
Liming Gao…
刊名:Journal of Materials Science: Materials in Electronics
出版年:2016
9.
TSV
- and delay-aware 3D-IC floorplanning
作者:
Mohammad A. Ahmed
;
S. Mohapatra…
关键词:
3D IC floorplanning
;
TSV
islands
;
Keep
;
out zone
;
Delay optimization
刊名:Analog Integrated Circuits and Signal Processing
出版年:2016
10.
Investigation of fused silica glass etching using C4F8/Ar inductively coupled plasmas for through glass
via
(TGV) applications
作者:
Laicun Lin
;
Xiangmeng Jing
;
Qidong Wang
;
Feng Jiang…
刊名:Microsystem Technologies
出版年:2016
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