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Elsevier电子期刊(79)
在“
Elsevier电子期刊
”中,
命中:
79
条,耗时:0.1049492 秒
在所有数据库中总计命中:
85
条
1.
Vacancy-related defects in n-type Si implanted with a rarefied
microbeam
of accelerated
heavy
ion
s in the MeV range
作者:
I. Capan
a
;
Ž. Pastuović
b
;
zkp@ansto.gov.au" class="auth_mail" title="E-mail the corresponding author
;
R. Siegele
b
;
R. Jaćimović
c
关键词:
Ion
implantat
ion
;
Silicon
;
Defects
;
Vacancy
;
DLTS
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2016
2.
Characterizat
ion
of high energy Xe
ion
irradiat
ion
effects in single crystal molybdenum with depth-resolved synchrotron
microbeam
diffract
ion
作者:
Di Yun
a
;
b
;
diyun1979@xjtu.edu.cn" class="auth_mail" title="E-mail the corresponding author
;
Yinbin Miao
c
;
Ruqing Xu
a
;
Zhigang Mei
a
;
Kun Mo
a
;
Walid Mohamed
a
;
Bei Ye
a
;
Michael J. Pellin
a
;
Abdellatif M. Yacout
a
关键词:
Microbeam
X-ray diffract
ion
;
Heavy
ion
irradiat
ion
;
Molecular dynamics
;
Depth-resolved X-ray diffract
ion
刊名:Journal of Nuclear Materials
出版年:2016
3.
Time-of-flight MeV-SIMS with beam induced secondary electron trigger
作者:
Martina Schulte-Borchers
;
marschul@phys.ethz.ch" class="auth_mail" title="E-mail the corresponding author
;
Max Dö
;
beli
;
Arnold Milenko Mü
;
ller
;
Matthias George
;
Hans-Arno Synal
关键词:
MeV SIMS
;
Secondary electrons
;
Secondary
ion
s
;
Heavy
ion
microbeam
;
Electron start
;
Molecular imaging
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2016
4.
Development of
microbeam
technology to expand applicat
ion
s at TIARA
作者:
T. Kamiya
a
;
;
T. Satoh
a
;
M. Koka
a
;
W. Kada
b
关键词:
Microbeam
;
Ion
beam analysis
;
Proton beam writing
;
Single
ion
hit
;
Diamond membrane detector
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2015
5.
Development of a TOF SIMS setup at the Zagreb
heavy
ion
microbeam
facility
作者:
Ton膷i Tadi膰
a
;
Iva Bogdanovi膰 Radovi膰
a
;
iva@irb.hr" class="auth_mail
;
Zdravko Siketi膰
a
;
Donny Domagoj Cosic
a
;
Natko Skukan
a
;
Milko Jak&scaron
;
i膰
a
;
Jiro Matsuo
b
关键词:
MeV SIMS
;
Heavy
ion
microbeam
;
Molecular imaging
;
Organic samples
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:1 August 2014
6.
The first interdisciplinary experiments at the IMP high energy
microbeam
作者:
Guanghua Du
a
;
;
Jinlong Guo
a
;
Ruqun Wu
a
;
Na Guo
a
;
Wenjing Liu
a
;
Fei Ye
a
;
Lina Sheng
a
;
Qiang Li
a
;
Huiyun Li
b
关键词:
High energy
microbeam
;
Bystander effect
;
Microbeam
therapy
;
RSA
;
Fault inject
ion
attack
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2015
7.
Continuous observat
ion
of polarizat
ion
effects in thin SC-CVD diamond detector designed for
heavy
ion
microbeam
measurement
作者:
Wataru Kada
a
;
kada.wataru@gunma-u.ac.jp" class="auth_mail
;
Naoya Iwamoto
b
;
Takahiro Satoh
c
;
Shinobu Onoda
b
;
Veljko Grilj
d
;
Natko Skukan
d
;
Masashi Koka
c
;
Takeshi Ohshima
b
;
Milko Jak&scaron
;
i膰
d
;
Tomihiro Kamiya
c
关键词:
Diamond
;
Polarizat
ion
effect
;
Microbeam
;
Beam focusing effect
;
IBIC
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:15 July 2014
8.
Applicat
ion
of
heavy
-
ion
microbeam
system at Kyoto University: Energy response for imaging plate by single
ion
irradiat
ion
作者:
M. Tosaki
a
;
tosaki.mitsuo.3v@kyoto-u.ac.jp
;
M. Nakamura
b
;
nakamura@wakayama-med.ac.jp
;
M. Hirose
c
;
hirose@scphys.kyoto-u.ac.jp
;
H. Matsumoto
c
;
mhiroshi@scphys.kyoto-u.ac.jp
关键词:
Heavy
-
ion
;
Microbeam
;
Single
ion
;
Imaging plate
;
Photo-stimulated luminescence
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2011
9.
Single
ion
hit detect
ion
set-up for the Zagreb
ion
microprobe
作者:
R.W. Smith
;
M. Karluš
;
ić
;
M. Jakš
;
ić
;
;
jaksic@irb.hr
关键词:
Single
ion
hit detect
ion
;
Channeltron
;
Swift
heavy
ion
;
Ion
microprobe
刊名:Nuclear Instruments and Methods in Physics Research Sect
ion
B: Beam Interact
ion
s with Materials and Atoms
出版年:2012
10.
Integrated
Ion
Beam Analysis (IBA) in Gunshot Residue (GSR) characterisat
ion
作者:
F.S. Romolo
;
M.E. Christopher
;
M. Donghi
;
L. Ripani
;
C. Jeynes
;
R.P. Webb
;
N.I. Ward
;
K.J. Kirkby
;
M.J. Bailey
关键词:
Gunshot Residue (GSR)
;
Firearms Discharge Residue (FDR)
;
Heavy
Metal Free (HMF) particles
;
Scanning Electron Microscope (SEM)
;
Energy Dispersive X-ray Spectrometer (EDS)
;
Ion
Beam Analysis (IBA)
刊名:Forensic Science Internat
ion
al
出版年:2013
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