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内部出版物
Elsevier电子期刊(6)
在“
Elsevier电子期刊
”中,
命中:
6
条,耗时:小于0.01 秒
在所有数据库中总计命中:
6
条
1.
Fabrication and characterization of
dual
AFM
probe with narrow-gapped silicon tips and switchable
cantilever
s with magneto-strictive FePd film actuator
作者:
Takashi Mineta
a
;
mineta-t@yz.yamagata-u.ac.jp
;
Kenta Kawashima
a
;
Ryoga Taguchi
b
关键词:
Dual
AFM
cantilever
;
FePd thin film
;
Magneto-strictive effect
;
Dual
silicon tip
刊名:Microelectronic Engineering
出版年:2017
2.
Dual
frequency atomic force microscopy on charged surfaces
作者:
Maximilian Baumann
;
Robert W. Stark
关键词:
Dynamic
AFM
;
Surface charges
;
Bimodal
AFM
刊名:Ultramicroscopy
出版年:2010
3.
Probing of local dissolution of Al-alloys in chloride solutions by
AFM
and SECM
作者:
A. Davoodi
;
J. Pan
;
C. Leygraf and S. Norgren
关键词:
Localized corrosion
;
Al alloys
;
Intermetallic particles
;
EC-
AFM
and SECM
刊名:Applied Surface Science
出版年:2006
4.
Nanoscale electrochemical probes for single cell analysis
作者:
R.J. Fasching
;
S.-J. Bai
;
T. Fabian and F.B. Prinz
关键词:
Electrochemical nano-probe
;
Single cell analysis
;
FIB
;
AFM
;
SECM
刊名:Microelectronic Engineering
出版年:2006
5.
Microfabricated torsion levers optimized for low force and high-frequency operation in fluids
作者:
Arthur Beyder and Frederick Sachs
关键词:
Atomic force microscopes
;
Magnetic force microscopes
;
Friction force microscopes
;
Microfabrication
;
Force
;
Friction
刊名:Ultramicroscopy
出版年:2006
6.
6.6 MHz silicon
AFM
cantilever
for high-speed readout in AFM-based recording
作者:
Hosaka
;
S.
;
Etoh
;
K.
;
Kikukawa
;
A.
;
Koyanagi
;
H.
;
Itoh
;
K.
刊名:Microelectronic Engineering
出版年:1999
1
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