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内部出版物
CNKI学位论文(309)
知网期刊论文(203)
在“
SpringerLink电子期刊
”中,
命中:
19
条,耗时:小于0.01 秒
在所有数据库中总计命中:
512
条
1.
FPGA Implementation of Heart Rate Monitoring System
作者:
D. Panigrahy
;
M. Rakshit
;
P. K. Sahu
关键词:
Electrocardiogram (ECG)
;
Field programmable gate array (FPGA)
;
MIT
;
BIH database
;
R peak
;
Shannon energy
刊名:Journal of Medical Systems
出版年:2016
2.
On the
Testability
of Properties Patterns
关键词:
Program specification
;
Software testing
;
Formal
verification
刊名:Lecture Notes in Computer Science
出版年:2015
3.
A Classification of Test Purposes Based on Testable Properties
关键词:
Program specification
;
Linear temporal logic
;
Software testing
;
Test purposes
;
Formal
verification
刊名:Lecture Notes in Computer Science
出版年:2015
4.
Popper and Wittgenstein on the Metaphysics of Experience
作者:
Harry Smit
关键词:
Basic statement
;
Bipolarity
;
Norms of representation
;
Ostensive definition
;
Synthetic a priori
刊名:Journal for General Philosophy of Science
出版年:2015
5.
Requirement Decomposition and
Testability
in Development of Safety-Critical Automotive Components,
作者:
Viacheslav Izosimov (1) viacheslav.izosimov@eis.semcon.com
Urban Ingelsson (1) urban.ingelsson@eis.semcon.com
Andreas Wallin (1) andreas.wallin@eis.semcon.com
刊名:Lecture Notes in Computer Science
出版年:2012
6.
Requirement Decomposition and
Testability
in Development of Safety-Critical Automotive Components,
作者:
Viacheslav Izosimov (18)
Urban Ingelsson (18)
Andreas Wallin (18)
刊名:Lecture Notes in Computer Science
出版年:2012
7.
Embedded System Level Self-Test for Mixed-Signal IO
Verification
作者:
V. Loukusa
关键词:
self
;
test
;
system level
;
DFT
;
testability
;
IO connectivity
;
mixed
;
signal
;
histogram
刊名:Journal of Electronic Testing
出版年:2006
8.
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
作者:
Hongxia Fang
;
Krishnendu Chakrabarty and Hideo Fujiwara
关键词:
DFT
;
Output deviations
;
RT
;
level
;
Test
;
point insertion
;
Unmodeled defects
刊名:Journal of Electronic Testing
出版年:2010
9.
Embedded System Level Self-Test for Mixed-Signal IO
Verification
作者:
V. Loukusa
关键词:
self
;
test
;
system level
;
DFT
;
testability
;
IO connectivity
;
mixed
;
signal
;
histogram
刊名:Journal of Electronic Testing
出版年:2006
10.
Testing for Refinement in CSP
作者:
Ana Cavalcanti
;
Marie-Claude Gaudel
刊名:Lecture Notes in Computer Science
出版年:2007
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